| ソフトウェア | | 名称 | バージョン | 分類 | NB |
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| DENZO | | データ削減 | | | SCALEPACK | | データスケーリング | | | SHARP | | 位相決定 | | | CNS | | 精密化 | | | REFMAC | | 精密化 | | | PDB_EXTRACT | 1.7 | データ抽出 | | | HKL-2000 | | データ削減 | |
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| 精密化 | 構造決定の手法: 単波長異常分散 / 解像度: 1.75→44.28 Å / Cor.coef. Fo:Fc: 0.952 / Cor.coef. Fo:Fc free: 0.936 / SU B: 5.27 / SU ML: 0.09 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.13 / ESU R Free: 0.122 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD
| Rfactor | 反射数 | %反射 | Selection details |
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| Rfree | 0.231 | 4923 | 5 % | RANDOM |
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| Rwork | 0.198 | - | - | - |
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| all | 0.2 | - | - | - |
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| obs | - | 98094 | 100 % | - |
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| 溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK |
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| 原子変位パラメータ | Biso mean: 25.27 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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| 1- | 1.98 Å2 | 0 Å2 | 0 Å2 |
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| 2- | - | -0.91 Å2 | 0 Å2 |
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| 3- | - | - | -1.07 Å2 |
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| 精密化ステップ | サイクル: LAST / 解像度: 1.75→44.28 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 7511 | 0 | 90 | 550 | 8151 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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| X-RAY DIFFRACTION | r_bond_refined_d| 0.012 | 0.021 | 7873 | | X-RAY DIFFRACTION | r_angle_refined_deg| 1.683 | 1.949 | 10838 | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg| 7.775 | 5 | 959 | | X-RAY DIFFRACTION | r_dihedral_angle_2_deg| 39.989 | 25.602 | 407 | | X-RAY DIFFRACTION | r_dihedral_angle_3_deg| 13.025 | 15 | 1171 | | X-RAY DIFFRACTION | r_dihedral_angle_4_deg| 19.924 | 15 | 14 | | X-RAY DIFFRACTION | r_chiral_restr| 0.096 | 0.2 | 1089 | | X-RAY DIFFRACTION | r_gen_planes_refined| 0.005 | 0.02 | 6210 | | X-RAY DIFFRACTION | r_nbd_refined| 0.201 | 0.2 | 4073 | | X-RAY DIFFRACTION | r_nbtor_refined| 0.307 | 0.2 | 5213 | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined| 0.127 | 0.2 | 682 | | X-RAY DIFFRACTION | r_metal_ion_refined| 0.198 | 0.2 | 6 | | X-RAY DIFFRACTION | r_symmetry_vdw_refined| 0.216 | 0.2 | 47 | | X-RAY DIFFRACTION | r_symmetry_hbond_refined| 0.163 | 0.2 | 18 | | X-RAY DIFFRACTION | r_mcbond_it| 0.499 | 1.5 | 4846 | | X-RAY DIFFRACTION | r_mcangle_it| 0.777 | 2 | 7659 | | X-RAY DIFFRACTION | r_scbond_it| 1.39 | 3 | 3480 | | X-RAY DIFFRACTION | r_scangle_it| 1.885 | 4.5 | 3115 | | | | | | | | | | | | | | | | | | |
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| LS精密化 シェル | 解像度: 1.75→1.796 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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| Rfree | 0.291 | 358 | - |
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| Rwork | 0.244 | 6642 | - |
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| all | - | 7000 | - |
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| obs | - | - | 100 % |
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| 精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION | ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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| 1 | 0.9651 | -0.3398 | -0.1748 | 0.8885 | -0.0303 | 1.5483 | 0.0466 | 0.0615 | 0.0032 | 0.0365 | -0.0175 | -0.0713 | 0.182 | 0.1939 | -0.0291 | -0.2037 | 0.0256 | -0.0402 | -0.1203 | -0.0214 | -0.1226 | 43.6894 | 38.9396 | 5.6175 | | 2 | 0.6696 | -0.2177 | -0.2159 | 2.2039 | -0.1725 | 0.7484 | -0.0251 | -0.0269 | 0.0812 | 0.8205 | 0.0992 | 0.2248 | -0.2583 | -0.0869 | -0.0741 | 0.187 | 0.0558 | 0.1165 | -0.1154 | 0.0179 | -0.0996 | 24.0836 | 67.5203 | 27.1085 | | 3 | 9.4024 | -6.3033 | -2.9964 | 9.7998 | -2.0077 | 5.8684 | -0.0382 | -0.0315 | 0.0204 | 0.3607 | 0.2062 | 0.5981 | -0.5267 | -0.2188 | -0.168 | -0.1974 | -0.0196 | 0.0612 | -0.1067 | 0.0232 | -0.0666 | 21.143 | 96.4999 | 12.8641 |
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| 精密化 TLSグループ | | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Label asym-ID | Auth seq-ID | Label seq-ID |
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| 1 | X-RAY DIFFRACTION | 1 | AA| 5 - 489 | 5 - 489 | | 2 | X-RAY DIFFRACTION | 2 | BB| 6 - 489 | 6 - 489 | | 3 | X-RAY DIFFRACTION | 3 | BG| 2001 | | | | | | | |
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