ソフトウェア 名称 バージョン 分類 REFMAC5.8.0430 (refmacat 0.4.100)精密化 CrystFELデータ削減 CrystFELデータスケーリング MOLREP位相決定
精密化 構造決定の手法 : 分子置換 / 解像度 : 1.68→55.064 Å / Cor.coef. Fo :Fc : 0.976 / Cor.coef. Fo :Fc free : 0.968 / SU B : 7.711 / SU ML : 0.096 / 交差検証法 : FREE R-VALUE / ESU R : 0.098 / ESU R Free : 0.078 / 詳細 : Hydrogens have been added in their riding positionsRfactor 反射数 %反射 Rfree 0.1923 1554 4.913 % Rwork 0.1686 30074 - all 0.17 - - obs - 31628 99.994 %
溶媒の処理 イオンプローブ半径 : 0.9 Å / 減衰半径 : 0.9 Å / VDWプローブ半径 : 1.5 Å / 溶媒モデル : MASK BULK SOLVENT原子変位パラメータ Biso mean : 29.58 Å2 Baniso -1 Baniso -2 Baniso -3 1- -2.341 Å2 0 Å2 -0 Å2 2- - -2.341 Å2 0 Å2 3- - - 4.682 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.68→55.064 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 1546 0 10 100 1656
拘束条件 大きな表を表示 (5 x 30) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.004 0.012 1662 X-RAY DIFFRACTION r_bond_other_d0.001 0.016 1498 X-RAY DIFFRACTION r_angle_refined_deg1.218 1.799 2277 X-RAY DIFFRACTION r_angle_other_deg0.445 1.753 3467 X-RAY DIFFRACTION r_dihedral_angle_1_deg6.846 5 226 X-RAY DIFFRACTION r_dihedral_angle_2_deg5.783 5 12 X-RAY DIFFRACTION r_dihedral_angle_3_deg10.906 10 256 X-RAY DIFFRACTION r_dihedral_angle_6_deg14.552 10 68 X-RAY DIFFRACTION r_chiral_restr0.065 0.2 246 X-RAY DIFFRACTION r_gen_planes_refined0.004 0.02 2031 X-RAY DIFFRACTION r_gen_planes_other0.001 0.02 399 X-RAY DIFFRACTION r_nbd_refined0.184 0.2 238 X-RAY DIFFRACTION r_symmetry_nbd_other0.194 0.2 1194 X-RAY DIFFRACTION r_nbtor_refined0.175 0.2 790 X-RAY DIFFRACTION r_symmetry_nbtor_other0.08 0.2 812 X-RAY DIFFRACTION r_xyhbond_nbd_refined0.105 0.2 62 X-RAY DIFFRACTION r_symmetry_nbd_refined0.254 0.2 4 X-RAY DIFFRACTION r_nbd_other0.237 0.2 47 X-RAY DIFFRACTION r_symmetry_xyhbond_nbd_refined0.084 0.2 5 X-RAY DIFFRACTION r_mcbond_it7.281 2.641 851 X-RAY DIFFRACTION r_mcbond_other7.202 2.64 851 X-RAY DIFFRACTION r_mcangle_it10.144 4.77 1069 X-RAY DIFFRACTION r_mcangle_other10.16 4.771 1070 X-RAY DIFFRACTION r_scbond_it10.399 3.059 811 X-RAY DIFFRACTION r_scbond_other10.394 3.059 810 X-RAY DIFFRACTION r_scangle_it14.927 5.44 1199 X-RAY DIFFRACTION r_scangle_other14.924 5.44 1199 X-RAY DIFFRACTION r_lrange_it18.406 26.722 1722 X-RAY DIFFRACTION r_lrange_other18.299 26.705 1715 X-RAY DIFFRACTION r_rigid_bond_restr7.799 3 3160
LS精密化 シェル Refine-ID : X-RAY DIFFRACTION / Total num. of bins used : 20
大きな表を表示 (11 x 20) 大きな表を隠す 解像度 (Å)Rfactor Rfree Num. reflection Rfree Rfactor Rwork Num. reflection Rwork Rfactor all Num. reflection all Fsc free Fsc work % reflection obs (%)WRfactor Rwork 1.68-1.724 0.339 88 0.359 2185 0.358 2274 0.937 0.918 99.956 0.36 1.724-1.771 0.386 99 0.36 2141 0.361 2240 0.917 0.924 100 0.36 1.771-1.822 0.38 123 0.35 2041 0.352 2164 0.911 0.939 100 0.346 1.822-1.878 0.335 108 0.31 1995 0.311 2103 0.944 0.951 100 0.299 1.878-1.94 0.34 99 0.283 1968 0.286 2067 0.936 0.964 100 0.265 1.94-2.008 0.323 100 0.247 1881 0.251 1981 0.945 0.969 100 0.226 2.008-2.083 0.224 92 0.219 1822 0.219 1914 0.972 0.979 100 0.191 2.083-2.168 0.214 101 0.17 1769 0.172 1870 0.965 0.986 100 0.145 2.168-2.264 0.174 82 0.157 1700 0.158 1782 0.978 0.989 100 0.132 2.264-2.375 0.177 79 0.141 1621 0.143 1700 0.981 0.99 100 0.119 2.375-2.503 0.153 83 0.135 1538 0.136 1621 0.988 0.991 100 0.117 2.503-2.655 0.221 87 0.149 1469 0.153 1556 0.968 0.986 100 0.128 2.655-2.837 0.209 62 0.154 1410 0.156 1472 0.97 0.986 100 0.134 2.837-3.064 0.179 73 0.134 1287 0.137 1360 0.984 0.99 100 0.121 3.064-3.355 0.161 62 0.132 1204 0.133 1266 0.982 0.99 100 0.12 3.355-3.75 0.118 51 0.119 1110 0.119 1161 0.99 0.992 100 0.112 3.75-4.326 0.123 67 0.114 968 0.114 1035 0.989 0.992 100 0.113 4.326-5.291 0.134 44 0.128 859 0.128 903 0.989 0.992 100 0.129 5.291-7.448 0.183 34 0.18 679 0.18 714 0.983 0.984 99.8599 0.179 7.448-55.064 0.23 20 0.18 427 0.181 447 0.981 0.981 100 0.201