Beg auth comp-ID: ARG / Beg label comp-ID: ARG / End auth comp-ID: ASP / End label comp-ID: ASP / Auth asym-ID: A / Label asym-ID: A / Auth seq-ID: 2 - 438 / Label seq-ID: 2 - 438
構造決定の手法: 分子置換 / 解像度: 2.2→48.139 Å / Cor.coef. Fo:Fc: 0.965 / Cor.coef. Fo:Fc free: 0.947 / SU B: 10.301 / SU ML: 0.128 / 交差検証法: FREE R-VALUE / ESU R: 0.189 / ESU R Free: 0.165 詳細: Hydrogens have been used if present in the input file
Rfactor
反射数
%反射
Rfree
0.2061
7610
5.015 %
Rwork
0.1639
144149
-
all
0.166
-
-
obs
-
151759
99.853 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 52.554 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.639 Å2
-0 Å2
0 Å2
2-
-
-0.79 Å2
-0 Å2
3-
-
-
-0.849 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.2→48.139 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
17040
0
265
880
18185
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.015
0.012
18047
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.016
16606
X-RAY DIFFRACTION
r_angle_refined_deg
2.344
1.837
24540
X-RAY DIFFRACTION
r_angle_other_deg
0.868
1.759
38328
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.988
5
2217
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
12.649
5
137
X-RAY DIFFRACTION
r_dihedral_angle_other_2_deg
12.085
5
29
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
14.233
10
3033
X-RAY DIFFRACTION
r_dihedral_angle_6_deg
15.397
10
865
X-RAY DIFFRACTION
r_chiral_restr
0.114
0.2
2682
X-RAY DIFFRACTION
r_gen_planes_refined
0.012
0.02
21453
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
4202
X-RAY DIFFRACTION
r_nbd_refined
0.238
0.2
3692
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.195
0.2
15469
X-RAY DIFFRACTION
r_nbtor_refined
0.189
0.2
8814
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.087
0.2
10124
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.196
0.2
872
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_other
0.06
0.2
3
X-RAY DIFFRACTION
r_metal_ion_refined
0.186
0.2
7
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.179
0.2
14
X-RAY DIFFRACTION
r_nbd_other
0.179
0.2
59
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.208
0.2
21
X-RAY DIFFRACTION
r_mcbond_it
3.281
2.535
8802
X-RAY DIFFRACTION
r_mcbond_other
3.281
2.535
8802
X-RAY DIFFRACTION
r_mcangle_it
4.41
4.536
11053
X-RAY DIFFRACTION
r_mcangle_other
4.411
4.533
11042
X-RAY DIFFRACTION
r_scbond_it
5.397
3.102
9245
X-RAY DIFFRACTION
r_scbond_other
5.397
3.102
9245
X-RAY DIFFRACTION
r_scangle_it
7.744
5.425
13481
X-RAY DIFFRACTION
r_scangle_other
7.744
5.425
13482
X-RAY DIFFRACTION
r_lrange_it
9.425
26.743
20212
X-RAY DIFFRACTION
r_lrange_other
9.441
26.02
20013
X-RAY DIFFRACTION
r_ncsr_local_group_1
0.135
0.05
13492
X-RAY DIFFRACTION
r_ncsr_local_group_2
0.116
0.05
13735
Refine LS restraints NCS
Ens-ID
Dom-ID
Auth asym-ID
Refine-ID
タイプ
Rms dev position (Å)
Weight position
1
1
A
X-RAY DIFFRACTION
Localncs
0.13544
0.05007
1
2
A
X-RAY DIFFRACTION
Localncs
0.13544
0.05007
2
3
A
X-RAY DIFFRACTION
Localncs
0.11584
0.05008
2
4
A
X-RAY DIFFRACTION
Localncs
0.11584
0.05008
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20