ソフトウェア 名称 バージョン 分類 REFMAC5.8.0425精密化 REFMAC5.8.0425精密化 Aimlessデータスケーリング autoPROCデータ削減 AutoProcessデータスケーリング MOLREP位相決定
精密化 構造決定の手法 : 分子置換 / 解像度 : 1.2→39.805 Å / Cor.coef. Fo :Fc : 0.98 / Cor.coef. Fo :Fc free : 0.969 / SU B : 0.849 / SU ML : 0.018 / 交差検証法 : FREE R-VALUE / ESU R : 0.035 / ESU R Free : 0.034 / 詳細 : Hydrogens have been added in their riding positionsRfactor 反射数 %反射 Rfree 0.1452 809 4.939 % Rwork 0.1216 15571 - all 0.123 - - obs - 16380 99.982 %
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : MASK BULK SOLVENT原子変位パラメータ Biso mean : 14.696 Å2 Baniso -1 Baniso -2 Baniso -3 1- -0.017 Å2 -0.009 Å2 -0 Å2 2- - -0.017 Å2 0 Å2 3- - - 0.057 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.2→39.805 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 457 0 3 72 532
拘束条件 大きな表を表示 (5 x 31) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.011 0.012 508 X-RAY DIFFRACTION r_bond_other_d0.003 0.016 470 X-RAY DIFFRACTION r_angle_refined_deg1.873 1.905 687 X-RAY DIFFRACTION r_angle_other_deg0.901 1.912 1105 X-RAY DIFFRACTION r_dihedral_angle_1_deg6.933 5 68 X-RAY DIFFRACTION r_dihedral_angle_2_deg5.036 5 3 X-RAY DIFFRACTION r_dihedral_angle_3_deg12.109 10 105 X-RAY DIFFRACTION r_dihedral_angle_6_deg17.626 10 26 X-RAY DIFFRACTION r_chiral_restr0.115 0.2 70 X-RAY DIFFRACTION r_gen_planes_refined0.01 0.02 591 X-RAY DIFFRACTION r_gen_planes_other0.003 0.02 105 X-RAY DIFFRACTION r_nbd_refined0.236 0.2 109 X-RAY DIFFRACTION r_symmetry_nbd_other0.187 0.2 414 X-RAY DIFFRACTION r_nbtor_refined0.165 0.2 236 X-RAY DIFFRACTION r_symmetry_nbtor_other0.08 0.2 260 X-RAY DIFFRACTION r_xyhbond_nbd_refined0.401 0.2 47 X-RAY DIFFRACTION r_symmetry_nbd_refined0.285 0.2 25 X-RAY DIFFRACTION r_nbd_other0.25 0.2 62 X-RAY DIFFRACTION r_symmetry_xyhbond_nbd_refined0.227 0.2 20 X-RAY DIFFRACTION r_xyhbond_nbd_other0.075 0.2 1 X-RAY DIFFRACTION r_mcbond_it3.668 1.148 239 X-RAY DIFFRACTION r_mcbond_other3.663 1.15 240 X-RAY DIFFRACTION r_mcangle_it5.674 2.059 300 X-RAY DIFFRACTION r_mcangle_other5.681 2.061 301 X-RAY DIFFRACTION r_scbond_it5.482 1.526 269 X-RAY DIFFRACTION r_scbond_other5.472 1.526 270 X-RAY DIFFRACTION r_scangle_it8.093 2.643 381 X-RAY DIFFRACTION r_scangle_other8.083 2.642 382 X-RAY DIFFRACTION r_lrange_it13.86 19.377 633 X-RAY DIFFRACTION r_lrange_other13.038 17.317 612 X-RAY DIFFRACTION r_rigid_bond_restr3.974 3 978
LS精密化 シェル Refine-ID : X-RAY DIFFRACTION / Total num. of bins used : 20
大きな表を表示 (11 x 20) 大きな表を隠す 解像度 (Å)Rfactor Rfree Num. reflection Rfree Rfactor Rwork Num. reflection Rwork Rfactor all Num. reflection all Fsc free Fsc work % reflection obs (%)WRfactor Rwork 1.2-1.231 0.138 46 0.131 1138 0.131 1186 0.99 0.989 99.8314 0.11 1.231-1.265 0.172 58 0.122 1095 0.124 1153 0.982 0.991 100 0.103 1.265-1.302 0.125 45 0.108 1084 0.109 1129 0.99 0.992 100 0.092 1.302-1.342 0.152 65 0.108 1044 0.111 1110 0.985 0.993 99.9099 0.091 1.342-1.385 0.12 60 0.103 1014 0.104 1074 0.991 0.994 100 0.09 1.385-1.434 0.101 62 0.095 956 0.095 1018 0.993 0.994 100 0.083 1.434-1.488 0.117 46 0.083 956 0.084 1002 0.991 0.996 100 0.073 1.488-1.549 0.113 45 0.086 924 0.087 969 0.991 0.995 100 0.077 1.549-1.618 0.11 66 0.088 843 0.09 909 0.992 0.995 100 0.083 1.618-1.696 0.12 45 0.09 860 0.092 905 0.992 0.995 100 0.086 1.696-1.788 0.124 49 0.101 778 0.102 827 0.989 0.994 100 0.098 1.788-1.896 0.115 46 0.102 774 0.103 820 0.992 0.994 100 0.101 1.896-2.027 0.115 23 0.113 730 0.113 753 0.993 0.993 100 0.115 2.027-2.189 0.135 39 0.118 671 0.119 710 0.99 0.992 100 0.126 2.189-2.397 0.171 23 0.122 630 0.124 653 0.981 0.991 100 0.13 2.397-2.678 0.14 23 0.144 567 0.144 590 0.987 0.988 100 0.164 2.678-3.091 0.185 18 0.134 517 0.136 535 0.98 0.989 100 0.16 3.091-3.779 0.116 21 0.125 437 0.125 458 0.993 0.991 100 0.152 3.779-5.321 0.233 22 0.146 340 0.15 362 0.978 0.989 100 0.178 5.321-39.805 0.326 7 0.254 213 0.256 220 0.957 0.96 100 0.299