Component-ID: 1 / Ens-ID: 1 / Beg auth comp-ID: SER / Beg label comp-ID: SER / End auth comp-ID: SER / End label comp-ID: SER / Auth asym-ID: A / Label asym-ID: A / Auth seq-ID: 3 - 533 / Label seq-ID: 3 - 533
Dom-ID
1
2
NCSアンサンブル: (詳細: Local NCS retraints between domains: 1 2)
プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.97946 Å / 相対比: 1
反射
解像度: 2.1→50 Å / Num. obs: 87750 / % possible obs: 98.8 % / 冗長度: 10 % / CC1/2: 0.997 / Rmerge(I) obs: 0.153 / Net I/σ(I): 8.5
反射 シェル
解像度: 2.1→2.22 Å / Rmerge(I) obs: 2.025 / Mean I/σ(I) obs: 0.8 / Num. unique obs: 12591 / CC1/2: 0.298
-
解析
ソフトウェア
名称
バージョン
分類
REFMAC
5.8.0425
精密化
XDS
データ削減
XDS
データスケーリング
REFMAC
位相決定
精密化
構造決定の手法: フーリエ合成 / 解像度: 2.1→47.906 Å / Cor.coef. Fo:Fc: 0.97 / Cor.coef. Fo:Fc free: 0.956 / SU B: 6.711 / SU ML: 0.155 / 交差検証法: THROUGHOUT / ESU R: 0.175 / ESU R Free: 0.151 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Rfree
0.2089
4497
5.125 %
Rwork
0.1801
83253
-
all
0.182
-
-
obs
-
87750
98.77 %
溶媒の処理
イオンプローブ半径: 0.9 Å / 減衰半径: 0.9 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 46.496 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.828 Å2
0.414 Å2
0 Å2
2-
-
0.828 Å2
-0 Å2
3-
-
-
-2.687 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.1→47.906 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
8153
0
76
987
9216
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.002
0.012
8660
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.016
8019
X-RAY DIFFRACTION
r_angle_refined_deg
0.914
1.835
11802
X-RAY DIFFRACTION
r_angle_other_deg
0.334
1.759
18550
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.806
5
1048
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
3.992
5
36
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
9.511
10
1389
X-RAY DIFFRACTION
r_dihedral_angle_6_deg
12.373
10
414
X-RAY DIFFRACTION
r_chiral_restr
0.047
0.2
1269
X-RAY DIFFRACTION
r_gen_planes_refined
0.003
0.02
10182
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
2010
X-RAY DIFFRACTION
r_nbd_refined
0.171
0.2
1423
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.175
0.2
7728
X-RAY DIFFRACTION
r_nbtor_refined
0.175
0.2
4093
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.078
0.2
4152
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.124
0.2
955
X-RAY DIFFRACTION
r_metal_ion_refined
0.096
0.2
2
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.148
0.2
6
X-RAY DIFFRACTION
r_nbd_other
0.162
0.2
51
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.159
0.2
20
X-RAY DIFFRACTION
r_mcbond_it
1.9
4.988
4144
X-RAY DIFFRACTION
r_mcbond_other
1.898
4.988
4144
X-RAY DIFFRACTION
r_mcangle_it
3.244
8.945
5199
X-RAY DIFFRACTION
r_mcangle_other
3.245
8.946
5200
X-RAY DIFFRACTION
r_scbond_it
2.086
5.253
4516
X-RAY DIFFRACTION
r_scbond_other
2.086
5.253
4517
X-RAY DIFFRACTION
r_scangle_it
3.581
9.521
6600
X-RAY DIFFRACTION
r_scangle_other
3.581
9.522
6601
X-RAY DIFFRACTION
r_lrange_it
6.841
130.285
9782
X-RAY DIFFRACTION
r_lrange_other
6.84
130.293
9781
X-RAY DIFFRACTION
r_ncsr_local_group_1
0.056
0.05
17180
Refine LS restraints NCS
Ens-ID
Dom-ID
Auth asym-ID
Refine-ID
タイプ
Rms dev position (Å)
Weight position
1
1
A
X-RAY DIFFRACTION
Localncs
0.05584
0.0501
1
2
A
X-RAY DIFFRACTION
Localncs
0.05584
0.0501
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20