構造決定の手法: フーリエ合成 / 解像度: 1.6→55.756 Å / Cor.coef. Fo:Fc: 0.978 / Cor.coef. Fo:Fc free: 0.969 / SU B: 4.068 / SU ML: 0.069 / 交差検証法: THROUGHOUT / ESU R: 0.082 / ESU R Free: 0.083 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Selection details
Rfree
0.1847
3798
5.093 %
Random
Rwork
0.1528
70771
-
-
all
0.154
-
-
-
obs
0.1544
74569
98.649 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 28.841 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.172 Å2
-0 Å2
0.831 Å2
2-
-
-1.044 Å2
0 Å2
3-
-
-
2.14 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.6→55.756 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4619
0
106
505
5230
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.009
0.012
4941
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.016
4714
X-RAY DIFFRACTION
r_angle_refined_deg
1.681
1.799
6740
X-RAY DIFFRACTION
r_angle_other_deg
0.575
1.716
10864
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.176
5
660
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
6.084
5
17
X-RAY DIFFRACTION
r_dihedral_angle_other_2_deg
0.023
5
2
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.65
10
775
X-RAY DIFFRACTION
r_dihedral_angle_6_deg
16.579
10
180
X-RAY DIFFRACTION
r_chiral_restr
0.088
0.2
820
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.02
5762
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
1036
X-RAY DIFFRACTION
r_nbd_refined
0.234
0.2
929
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.189
0.2
4216
X-RAY DIFFRACTION
r_nbtor_refined
0.172
0.2
2425
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.08
0.2
2618
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.221
0.2
352
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_other
0.017
0.2
1
X-RAY DIFFRACTION
r_metal_ion_refined
0.099
0.2
10
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.245
0.2
19
X-RAY DIFFRACTION
r_nbd_other
0.206
0.2
59
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.225
0.2
21
X-RAY DIFFRACTION
r_mcbond_it
1.514
1.697
2595
X-RAY DIFFRACTION
r_mcbond_other
1.507
1.697
2595
X-RAY DIFFRACTION
r_mcangle_it
2.196
3.043
3270
X-RAY DIFFRACTION
r_mcangle_other
2.196
3.044
3271
X-RAY DIFFRACTION
r_scbond_it
2.595
2.092
2346
X-RAY DIFFRACTION
r_scbond_other
2.594
2.092
2346
X-RAY DIFFRACTION
r_scangle_it
3.908
3.68
3470
X-RAY DIFFRACTION
r_scangle_other
3.907
3.68
3471
X-RAY DIFFRACTION
r_lrange_it
6.338
20.11
5436
X-RAY DIFFRACTION
r_lrange_other
6.234
19.057
5289
X-RAY DIFFRACTION
r_ncsr_local_group_1
0.102
0.05
9685
Refine LS restraints NCS
Ens-ID
Dom-ID
Auth asym-ID
Refine-ID
タイプ
Rms dev position (Å)
Weight position
1
1
A
X-RAY DIFFRACTION
Localncs
0.10246
0.05008
1
2
A
X-RAY DIFFRACTION
Localncs
0.10246
0.05008
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20