ソフトウェア | 名称 | バージョン | 分類 |
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PHENIX | 1.14_3260精密化 | iMOSFLM | | データ削減 | Aimless | | データスケーリング | PHASER | | 位相決定 | Coot | | モデル構築 | |
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精密化 | 構造決定の手法: 分子置換 / 解像度: 1.49→46.97 Å / SU ML: 0.1693 / 交差検証法: FREE R-VALUE / σ(F): 1.34 / 位相誤差: 20.4039 / 立体化学のターゲット値: CDL v1.2
| Rfactor | 反射数 | %反射 |
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Rfree | 0.1912 | 4124 | 5 % |
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Rwork | 0.167 | 78388 | - |
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obs | 0.1683 | 82512 | 99.75 % |
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溶媒の処理 | 減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL |
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原子変位パラメータ | Biso mean: 27.05 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 1.49→46.97 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 3673 | 0 | 25 | 461 | 4159 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | 数 |
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X-RAY DIFFRACTION | f_bond_d0.005 | 3781 | X-RAY DIFFRACTION | f_angle_d0.8269 | 5158 | X-RAY DIFFRACTION | f_chiral_restr0.0767 | 592 | X-RAY DIFFRACTION | f_plane_restr0.0061 | 676 | X-RAY DIFFRACTION | f_dihedral_angle_d15.5972 | 2110 | | | | | |
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LS精密化 シェル | 解像度 (Å) | Rfactor Rfree | Num. reflection Rfree | Rfactor Rwork | Num. reflection Rwork | Refine-ID | % reflection obs (%) |
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1.49-1.51 | 0.3184 | 141 | 0.317 | 2669 | X-RAY DIFFRACTION | 100 | 1.51-1.53 | 0.3291 | 175 | 0.3093 | 2585 | X-RAY DIFFRACTION | 99.82 | 1.53-1.55 | 0.3057 | 122 | 0.3129 | 2698 | X-RAY DIFFRACTION | 99.79 | 1.55-1.57 | 0.3088 | 127 | 0.2899 | 2666 | X-RAY DIFFRACTION | 99.89 | 1.57-1.59 | 0.3006 | 122 | 0.2849 | 2733 | X-RAY DIFFRACTION | 99.55 | 1.59-1.61 | 0.3039 | 114 | 0.2597 | 2639 | X-RAY DIFFRACTION | 99.93 | 1.61-1.63 | 0.2653 | 126 | 0.2302 | 2718 | X-RAY DIFFRACTION | 99.89 | 1.63-1.66 | 0.3004 | 118 | 0.2264 | 2665 | X-RAY DIFFRACTION | 99.96 | 1.66-1.69 | 0.2349 | 146 | 0.2145 | 2685 | X-RAY DIFFRACTION | 99.89 | 1.69-1.72 | 0.2518 | 145 | 0.2019 | 2677 | X-RAY DIFFRACTION | 99.79 | 1.72-1.75 | 0.2396 | 151 | 0.2012 | 2632 | X-RAY DIFFRACTION | 99.86 | 1.75-1.78 | 0.2171 | 154 | 0.1897 | 2681 | X-RAY DIFFRACTION | 99.82 | 1.78-1.82 | 0.2075 | 124 | 0.1905 | 2685 | X-RAY DIFFRACTION | 99.79 | 1.82-1.86 | 0.2366 | 139 | 0.1818 | 2621 | X-RAY DIFFRACTION | 99.71 | 1.86-1.9 | 0.1962 | 113 | 0.1772 | 2742 | X-RAY DIFFRACTION | 99.65 | 1.9-1.95 | 0.2031 | 131 | 0.1667 | 2735 | X-RAY DIFFRACTION | 99.65 | 1.95-2 | 0.2161 | 118 | 0.154 | 2673 | X-RAY DIFFRACTION | 99.96 | 2-2.06 | 0.1715 | 127 | 0.1521 | 2713 | X-RAY DIFFRACTION | 99.93 | 2.06-2.12 | 0.1546 | 144 | 0.1487 | 2705 | X-RAY DIFFRACTION | 99.93 | 2.12-2.2 | 0.1792 | 165 | 0.1457 | 2691 | X-RAY DIFFRACTION | 99.96 | 2.2-2.29 | 0.1786 | 162 | 0.1491 | 2664 | X-RAY DIFFRACTION | 100 | 2.29-2.39 | 0.1872 | 153 | 0.1536 | 2678 | X-RAY DIFFRACTION | 99.02 | 2.39-2.52 | 0.1781 | 150 | 0.1564 | 2731 | X-RAY DIFFRACTION | 99.93 | 2.52-2.68 | 0.1881 | 156 | 0.1607 | 2746 | X-RAY DIFFRACTION | 100 | 2.68-2.88 | 0.1924 | 152 | 0.1569 | 2724 | X-RAY DIFFRACTION | 100 | 2.88-3.17 | 0.203 | 125 | 0.1529 | 2777 | X-RAY DIFFRACTION | 100 | 3.17-3.63 | 0.1712 | 194 | 0.1443 | 2718 | X-RAY DIFFRACTION | 98.71 | 3.63-4.58 | 0.1502 | 164 | 0.1315 | 2798 | X-RAY DIFFRACTION | 99.97 | 4.58-46.97 | 0.1799 | 166 | 0.1735 | 2939 | X-RAY DIFFRACTION | 98.6 |
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精密化 TLS | 手法: refined / Origin x: -33.7049027239 Å / Origin y: 12.5201372712 Å / Origin z: -22.5507312002 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
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T | 0.122044021177 Å2 | 0.0123966824612 Å2 | 0.0172305048206 Å2 | - | 0.136720224572 Å2 | 0.000161531521399 Å2 | - | - | 0.150070360992 Å2 |
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L | 0.633882857722 °2 | -0.232914857062 °2 | -0.305698800751 °2 | - | 0.662276125882 °2 | 0.20215293844 °2 | - | - | 1.16165830837 °2 |
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S | 0.0365963321586 Å ° | -0.0563638521199 Å ° | 0.0608443708229 Å ° | 0.0728309965308 Å ° | 0.0549921022333 Å ° | -0.0526286848123 Å ° | -0.0256253687731 Å ° | 0.105865766553 Å ° | -0.0715439222965 Å ° |
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精密化 TLSグループ | Selection details: all |
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