ソフトウェア | 名称 | バージョン | 分類 |
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PHENIX | 1.14_3260精密化 | iMOSFLM | | データ削減 | Aimless | | データスケーリング | PHASER | | 位相決定 | Coot | | モデル構築 | |
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精密化 | 構造決定の手法: 分子置換 / 解像度: 1.29→47.0759 Å / SU ML: 0.16 / 交差検証法: FREE R-VALUE / σ(F): 1.34 / 位相誤差: 18.57 / 立体化学のターゲット値: ML
| Rfactor | 反射数 | %反射 |
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Rfree | 0.1837 | 6085 | 4.8 % |
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Rwork | 0.1673 | - | - |
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obs | 0.1681 | 126755 | 99.87 % |
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溶媒の処理 | 減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL |
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精密化ステップ | サイクル: LAST / 解像度: 1.29→47.0759 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 3666 | 0 | 46 | 504 | 4216 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | 数 |
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X-RAY DIFFRACTION | f_bond_d0.005 | 3860 | X-RAY DIFFRACTION | f_angle_d0.838 | 5278 | X-RAY DIFFRACTION | f_dihedral_angle_d11.129 | 2142 | X-RAY DIFFRACTION | f_chiral_restr0.076 | 604 | X-RAY DIFFRACTION | f_plane_restr0.006 | 700 | | | | | |
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LS精密化 シェル | 解像度 (Å) | Rfactor Rfree | Num. reflection Rfree | Rfactor Rwork | Num. reflection Rwork | Refine-ID | % reflection obs (%) |
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1.29-1.3047 | 0.3498 | 207 | 0.3412 | 4027 | X-RAY DIFFRACTION | 100 | 1.3047-1.32 | 0.3182 | 195 | 0.3175 | 3912 | X-RAY DIFFRACTION | 100 | 1.32-1.3361 | 0.313 | 228 | 0.31 | 4002 | X-RAY DIFFRACTION | 100 | 1.3361-1.353 | 0.3152 | 203 | 0.3102 | 3884 | X-RAY DIFFRACTION | 100 | 1.353-1.3708 | 0.2931 | 225 | 0.2952 | 3956 | X-RAY DIFFRACTION | 100 | 1.3708-1.3896 | 0.29 | 185 | 0.2759 | 3982 | X-RAY DIFFRACTION | 100 | 1.3896-1.4095 | 0.2534 | 236 | 0.2528 | 3928 | X-RAY DIFFRACTION | 100 | 1.4095-1.4305 | 0.249 | 201 | 0.244 | 4011 | X-RAY DIFFRACTION | 100 | 1.4305-1.4529 | 0.2373 | 205 | 0.2332 | 3966 | X-RAY DIFFRACTION | 100 | 1.4529-1.4767 | 0.2422 | 211 | 0.2207 | 3968 | X-RAY DIFFRACTION | 100 | 1.4767-1.5021 | 0.2271 | 220 | 0.211 | 3971 | X-RAY DIFFRACTION | 100 | 1.5021-1.5295 | 0.2305 | 182 | 0.1968 | 3952 | X-RAY DIFFRACTION | 100 | 1.5295-1.5589 | 0.2104 | 210 | 0.1967 | 4000 | X-RAY DIFFRACTION | 100 | 1.5589-1.5907 | 0.223 | 198 | 0.1984 | 3998 | X-RAY DIFFRACTION | 100 | 1.5907-1.6253 | 0.2066 | 187 | 0.1865 | 3997 | X-RAY DIFFRACTION | 100 | 1.6253-1.6631 | 0.1911 | 165 | 0.1754 | 4012 | X-RAY DIFFRACTION | 100 | 1.6631-1.7047 | 0.1722 | 216 | 0.1638 | 4017 | X-RAY DIFFRACTION | 100 | 1.7047-1.7508 | 0.1994 | 206 | 0.1599 | 3976 | X-RAY DIFFRACTION | 100 | 1.7508-1.8023 | 0.1952 | 232 | 0.1616 | 3952 | X-RAY DIFFRACTION | 100 | 1.8023-1.8605 | 0.1743 | 191 | 0.1519 | 4037 | X-RAY DIFFRACTION | 100 | 1.8605-1.927 | 0.1547 | 184 | 0.1516 | 4023 | X-RAY DIFFRACTION | 100 | 1.927-2.0041 | 0.1698 | 184 | 0.1561 | 4056 | X-RAY DIFFRACTION | 100 | 2.0041-2.0953 | 0.1498 | 234 | 0.1467 | 4043 | X-RAY DIFFRACTION | 100 | 2.0953-2.2058 | 0.1652 | 229 | 0.1417 | 3991 | X-RAY DIFFRACTION | 100 | 2.2058-2.344 | 0.1631 | 205 | 0.1461 | 4076 | X-RAY DIFFRACTION | 100 | 2.344-2.525 | 0.1901 | 183 | 0.1549 | 4066 | X-RAY DIFFRACTION | 100 | 2.525-2.7791 | 0.1808 | 173 | 0.1557 | 4146 | X-RAY DIFFRACTION | 100 | 2.7791-3.1811 | 0.1476 | 212 | 0.1524 | 4108 | X-RAY DIFFRACTION | 100 | 3.1811-4.0075 | 0.1563 | 177 | 0.1387 | 4197 | X-RAY DIFFRACTION | 100 | 4.0075-47.0759 | 0.1743 | 201 | 0.1629 | 4416 | X-RAY DIFFRACTION | 99 |
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精密化 TLS | 手法: refined / Origin x: -23.2061 Å / Origin y: 15.0232 Å / Origin z: 19.0112 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
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T | 0.1281 Å2 | 0.0034 Å2 | -0.0069 Å2 | - | 0.0913 Å2 | 0.0137 Å2 | - | - | 0.1195 Å2 |
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L | 0.3505 °2 | 0.1511 °2 | -0.0276 °2 | - | 0.7385 °2 | -0.3551 °2 | - | - | 1.0814 °2 |
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S | 0.0508 Å ° | -0.0413 Å ° | 0.0212 Å ° | 0.0796 Å ° | 0.0252 Å ° | 0.0777 Å ° | -0.1032 Å ° | -0.0773 Å ° | -0.0463 Å ° |
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精密化 TLSグループ | Selection details: all |
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