ソフトウェア | 名称 | バージョン | 分類 |
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PHENIX | (1.19.2_4158: ???)精密化 | XDS | | データ削減 | XDS | | データスケーリング | PHASER | | 位相決定 | |
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精密化 | 構造決定の手法: 分子置換 / 解像度: 2.15→101.03 Å / SU ML: 0.43 / 交差検証法: FREE R-VALUE / σ(F): 1.34 / 位相誤差: 39.31 / 立体化学のターゲット値: ML
| Rfactor | 反射数 | %反射 |
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Rfree | 0.3339 | 2937 | 3.42 % |
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Rwork | 0.3118 | - | - |
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obs | 0.3126 | 85958 | 99.9 % |
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溶媒の処理 | 減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL |
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精密化ステップ | サイクル: LAST / 解像度: 2.15→101.03 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 0 | 1376 | 28 | 70 | 1474 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | 数 |
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X-RAY DIFFRACTION | f_bond_d0.005 | 1567 | X-RAY DIFFRACTION | f_angle_d0.918 | 2448 | X-RAY DIFFRACTION | f_dihedral_angle_d12.233 | 766 | X-RAY DIFFRACTION | f_chiral_restr0.039 | 319 | X-RAY DIFFRACTION | f_plane_restr0.007 | 67 | | | | | |
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LS精密化 シェル | 解像度 (Å) | Rfactor Rfree | Num. reflection Rfree | Rfactor Rwork | Num. reflection Rwork | Refine-ID | % reflection obs (%) |
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2.15-2.19 | 0.4777 | 141 | 0.4117 | 3963 | X-RAY DIFFRACTION | 100 | 2.19-2.22 | 0.3203 | 138 | 0.3983 | 3931 | X-RAY DIFFRACTION | 100 | 2.22-2.26 | 0.3814 | 140 | 0.415 | 3927 | X-RAY DIFFRACTION | 100 | 2.26-2.31 | 0.3957 | 138 | 0.3719 | 3983 | X-RAY DIFFRACTION | 100 | 2.31-2.35 | 0.3597 | 143 | 0.3517 | 3956 | X-RAY DIFFRACTION | 100 | 2.35-2.41 | 0.3633 | 139 | 0.3441 | 3977 | X-RAY DIFFRACTION | 100 | 2.41-2.46 | 0.4166 | 145 | 0.3558 | 3957 | X-RAY DIFFRACTION | 100 | 2.46-2.52 | 0.4112 | 144 | 0.3574 | 3947 | X-RAY DIFFRACTION | 100 | 2.52-2.59 | 0.4002 | 139 | 0.3671 | 3923 | X-RAY DIFFRACTION | 100 | 2.59-2.67 | 0.3836 | 141 | 0.3748 | 3943 | X-RAY DIFFRACTION | 100 | 2.67-2.75 | 0.4328 | 139 | 0.3913 | 3989 | X-RAY DIFFRACTION | 100 | 2.75-2.85 | 0.4642 | 139 | 0.4005 | 3936 | X-RAY DIFFRACTION | 100 | 2.85-2.97 | 0.3202 | 140 | 0.3646 | 3961 | X-RAY DIFFRACTION | 100 | 2.97-3.1 | 0.3585 | 138 | 0.3069 | 3943 | X-RAY DIFFRACTION | 100 | 3.1-3.26 | 0.3075 | 139 | 0.2866 | 3954 | X-RAY DIFFRACTION | 100 | 3.26-3.47 | 0.3026 | 133 | 0.2706 | 3942 | X-RAY DIFFRACTION | 100 | 3.47-3.74 | 0.2808 | 146 | 0.2634 | 3935 | X-RAY DIFFRACTION | 100 | 3.74-4.11 | 0.311 | 138 | 0.2972 | 3955 | X-RAY DIFFRACTION | 100 | 4.11-4.71 | 0.3522 | 137 | 0.3021 | 3966 | X-RAY DIFFRACTION | 100 | 4.71-5.93 | 0.2788 | 140 | 0.2691 | 3964 | X-RAY DIFFRACTION | 100 | 5.93-101.03 | 0.2858 | 140 | 0.2702 | 3969 | X-RAY DIFFRACTION | 100 |
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精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 5.7901 | -3.3329 | -4.0624 | 3.8376 | 1.6129 | 3.5545 | -1.3544 | -0.208 | -1.525 | 1.0463 | 0.5493 | -0.1844 | 0.8359 | 0.5367 | 0.6067 | 0.2215 | 0.0467 | 0.0986 | 0.7126 | -0.0457 | 1.0835 | 49.6759 | -11.4142 | 18.6035 | 2 | 0.4653 | 0.4925 | -0.2795 | 2.7769 | -0.4167 | 2.435 | -0.0895 | -0.0732 | -0.1812 | -0.0596 | 0.005 | -0.2399 | 0.1694 | 0.2158 | -0.0507 | 0.1887 | 0.0325 | -0.0016 | 0.2966 | -0.0044 | 0.3752 | 31.6836 | -3.3884 | 19.4617 | 3 | 1.8541 | -1.7439 | -0.299 | 2.3544 | 0.6066 | 2.9443 | -0.1297 | 0.0231 | -0.2493 | -0.1615 | -0.0547 | 0.6933 | 0.1278 | -0.4605 | 0.1045 | 0.3029 | -0.1098 | -0.0094 | 0.4533 | 0.0071 | 0.5519 | 78.8135 | -4.8521 | 11.628 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Selection details |
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1 | X-RAY DIFFRACTION | 1 | chain 'A' and (resid 1 through 10 )2 | X-RAY DIFFRACTION | 2 | chain 'A' and (resid 11 through 45 )3 | X-RAY DIFFRACTION | 3 | chain 'A' and (resid 46 through 64 ) | | |
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