Type: DECTRIS EIGER X 16M / Detector: PIXEL / Date: Oct 11, 2020
Radiation
Monochromator: Si111 / Protocol: SINGLE WAVELENGTH / Monochromatic (M) / Laue (L): M / Scattering type: x-ray
Radiation wavelength
Wavelength: 0.9 Å / Relative weight: 1
Reflection
Resolution: 2.8→50 Å / Num. obs: 97911 / % possible obs: 99.7 % / Redundancy: 3.6 % / CC1/2: 0.999 / Rmerge(I) obs: 0.062 / Net I/σ(I): 13.5
Reflection shell
Resolution: 2.8→2.97 Å / Redundancy: 3.4 % / Rmerge(I) obs: 0.918 / Mean I/σ(I) obs: 1.2 / Num. unique obs: 31767 / CC1/2: 0.569 / % possible all: 99.3
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Processing
Software
Name
Version
Classification
REFMAC
5.8.0267
refinement
XDS
datareduction
XDS
datascaling
AutoSol
phasing
Refinement
Method to determine structure: SAD / Resolution: 2.8→47.92 Å / Cor.coef. Fo:Fc: 0.955 / Cor.coef. Fo:Fc free: 0.924 / SU B: 12.953 / SU ML: 0.233 / Cross valid method: THROUGHOUT / ESU R: 0.406 / ESU R Free: 0.27 / Stereochemistry target values: MAXIMUM LIKELIHOOD / Details: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
Num. reflection
% reflection
Selection details
Rfree
0.22823
5042
4.9 %
RANDOM
Rwork
0.19124
-
-
-
obs
0.19304
97911
99.85 %
-
Solvent computation
Ion probe radii: 0.8 Å / Shrinkage radii: 0.8 Å / VDW probe radii: 1.2 Å / Solvent model: MASK