ソフトウェア 名称 バージョン 分類 REFMAC5.8.0411精密化 CrysalisProデータ削減 CrysalisProデータスケーリング MOLREP位相決定
精密化 構造決定の手法 : 分子置換 / 解像度 : 1.5→29.126 Å / Cor.coef. Fo :Fc : 0.979 / Cor.coef. Fo :Fc free : 0.958 / SU B : 4.271 / SU ML : 0.065 / 交差検証法 : FREE R-VALUE / ESU R : 0.072 / ESU R Free : 0.073 / 詳細 : Hydrogens have been added in their riding positionsRfactor 反射数 %反射 Rfree 0.2088 4975 5.176 % Rwork 0.15 91144 - all 0.153 - - obs - 96119 99.751 %
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : MASK BULK SOLVENT原子変位パラメータ Biso mean : 20.523 Å2 Baniso -1 Baniso -2 Baniso -3 1- -0.048 Å2 -0.024 Å2 -0 Å2 2- - -0.048 Å2 0 Å2 3- - - 0.156 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.5→29.126 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 4063 0 38 608 4709
拘束条件 大きな表を表示 (5 x 32) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.015 0.012 4192 X-RAY DIFFRACTION r_bond_other_d0.001 0.016 4037 X-RAY DIFFRACTION r_angle_refined_deg2.009 1.651 5676 X-RAY DIFFRACTION r_angle_other_deg0.675 1.568 9280 X-RAY DIFFRACTION r_dihedral_angle_1_deg6.103 5 540 X-RAY DIFFRACTION r_dihedral_angle_2_deg9.008 5 30 X-RAY DIFFRACTION r_dihedral_angle_3_deg13.635 10 708 X-RAY DIFFRACTION r_dihedral_angle_6_deg16.773 10 180 X-RAY DIFFRACTION r_chiral_restr0.104 0.2 653 X-RAY DIFFRACTION r_gen_planes_refined0.012 0.02 4972 X-RAY DIFFRACTION r_gen_planes_other0.001 0.02 944 X-RAY DIFFRACTION r_nbd_refined0.239 0.2 972 X-RAY DIFFRACTION r_symmetry_nbd_other0.184 0.2 3910 X-RAY DIFFRACTION r_nbtor_refined0.183 0.2 2131 X-RAY DIFFRACTION r_symmetry_nbtor_other0.082 0.2 2356 X-RAY DIFFRACTION r_xyhbond_nbd_refined0.227 0.2 411 X-RAY DIFFRACTION r_symmetry_xyhbond_nbd_other0.053 0.2 1 X-RAY DIFFRACTION r_metal_ion_refined0.454 0.2 3 X-RAY DIFFRACTION r_symmetry_nbd_refined0.255 0.2 10 X-RAY DIFFRACTION r_nbd_other0.209 0.2 37 X-RAY DIFFRACTION r_symmetry_xyhbond_nbd_refined0.275 0.2 23 X-RAY DIFFRACTION r_mcbond_it2.018 2.003 2152 X-RAY DIFFRACTION r_mcbond_other2.003 2.002 2151 X-RAY DIFFRACTION r_mcangle_it2.526 3.599 2694 X-RAY DIFFRACTION r_mcangle_other2.532 3.6 2695 X-RAY DIFFRACTION r_scbond_it2.702 2.39 2040 X-RAY DIFFRACTION r_scbond_other2.702 2.391 2041 X-RAY DIFFRACTION r_scangle_it3.476 4.214 2982 X-RAY DIFFRACTION r_scangle_other3.476 4.215 2983 X-RAY DIFFRACTION r_lrange_it4.403 23.809 5041 X-RAY DIFFRACTION r_lrange_other4.398 23.804 5038 X-RAY DIFFRACTION r_rigid_bond_restr5.93 3 8229
LS精密化 シェル Refine-ID : X-RAY DIFFRACTION / Total num. of bins used : 20
大きな表を表示 (11 x 20) 大きな表を隠す 解像度 (Å)Rfactor Rfree Num. reflection Rfree Rfactor Rwork Num. reflection Rwork Rfactor all Num. reflection all Fsc free Fsc work % reflection obs (%)WRfactor Rwork 1.5-1.539 0.341 375 0.339 6661 0.339 7072 0.918 0.918 99.491 0.341 1.539-1.581 0.341 357 0.295 6547 0.298 6904 0.915 0.937 100 0.297 1.581-1.627 0.294 319 0.264 6348 0.266 6667 0.939 0.95 100 0.263 1.627-1.676 0.278 361 0.218 6222 0.222 6583 0.946 0.967 100 0.214 1.676-1.731 0.266 336 0.198 5992 0.201 6329 0.95 0.973 99.9842 0.191 1.731-1.792 0.229 339 0.164 5751 0.168 6090 0.967 0.983 100 0.154 1.792-1.859 0.249 277 0.167 5647 0.171 5928 0.961 0.984 99.9325 0.149 1.859-1.935 0.234 296 0.149 5390 0.154 5687 0.968 0.987 99.9824 0.127 1.935-2.02 0.225 273 0.133 5194 0.137 5469 0.971 0.99 99.9634 0.111 2.02-2.119 0.187 227 0.121 4972 0.124 5205 0.98 0.992 99.8847 0.103 2.119-2.232 0.196 282 0.119 4667 0.123 4964 0.976 0.992 99.6978 0.098 2.232-2.367 0.192 264 0.117 4418 0.122 4697 0.978 0.992 99.6806 0.095 2.367-2.529 0.178 217 0.102 4224 0.106 4465 0.982 0.994 99.4625 0.085 2.529-2.73 0.191 185 0.117 3898 0.12 4113 0.978 0.992 99.2706 0.098 2.73-2.988 0.173 224 0.126 3569 0.129 3814 0.982 0.991 99.4494 0.108 2.988-3.336 0.198 175 0.127 3245 0.131 3443 0.977 0.991 99.332 0.113 3.336-3.844 0.174 154 0.144 2889 0.145 3054 0.982 0.989 99.6398 0.136 3.844-4.688 0.181 144 0.127 2459 0.13 2620 0.98 0.991 99.3511 0.124 4.688-6.545 0.195 108 0.157 1924 0.159 2037 0.981 0.988 99.7545 0.153 6.545-29.126 0.203 62 0.16 1127 0.162 1202 0.976 0.986 98.9185 0.157