Type: DECTRIS EIGER X 16M / Detector: PIXEL / Date: Nov 5, 2022
Radiation
Protocol: SINGLE WAVELENGTH / Monochromatic (M) / Laue (L): M / Scattering type: x-ray
Radiation wavelength
Wavelength: 0.97918 Å / Relative weight: 1
Reflection
Resolution: 2.89→50 Å / Num. obs: 10542 / % possible obs: 99.8 % / Redundancy: 9.9 % / CC1/2: 1 / Rmerge(I) obs: 0.049 / Net I/σ(I): 21.53
Reflection shell
Resolution: 2.89→3.07 Å / Rmerge(I) obs: 2.692 / Mean I/σ(I) obs: 0.77 / Num. unique obs: 1651 / CC1/2: 0.694
-
Processing
Software
Name
Version
Classification
REFMAC
5.8.0403
refinement
XDS
datareduction
XDS
datascaling
PHASER
phasing
Refinement
Method to determine structure: MOLECULAR REPLACEMENT / Resolution: 2.89→45.56 Å / Cor.coef. Fo:Fc: 0.947 / Cor.coef. Fo:Fc free: 0.898 / SU B: 28.648 / SU ML: 0.5 / Cross valid method: THROUGHOUT / ESU R Free: 0.457 / Stereochemistry target values: MAXIMUM LIKELIHOOD / Details: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
Num. reflection
% reflection
Selection details
Rfree
0.29609
527
5 %
RANDOM
Rwork
0.24942
-
-
-
obs
0.25172
10013
99.85 %
-
Solvent computation
Ion probe radii: 0.9 Å / Shrinkage radii: 0.9 Å / VDW probe radii: 1.2 Å / Solvent model: MASK