構造決定の手法: 単波長異常分散 / 解像度: 1.62→41.17 Å / Cor.coef. Fo:Fc: 0.954 / Cor.coef. Fo:Fc free: 0.944 / SU B: 3.485 / SU ML: 0.062 / 交差検証法: THROUGHOUT / ESU R: 0.09 / ESU R Free: 0.088 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: U VALUES : WITH TLS ADDED HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES : RESIDUAL ONLY
Rfactor
反射数
%反射
Selection details
Rfree
0.21059
2405
5 %
RANDOM
Rwork
0.18474
-
-
-
obs
0.186
46108
99.72 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 23.489 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.05 Å2
-0 Å2
-0 Å2
2-
-
0.04 Å2
-0 Å2
3-
-
-
1.01 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.62→41.17 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2734
0
30
216
2980
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.008
0.018
2818
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.019
2753
X-RAY DIFFRACTION
r_angle_refined_deg
1.336
1.892
3802
X-RAY DIFFRACTION
r_angle_other_deg
1.109
2.713
6360
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.647
5
345
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
34.966
22.153
144
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
11.407
15
520
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
12.808
15
19
X-RAY DIFFRACTION
r_chiral_restr
0.088
0.2
418
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.02
3120
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
630
X-RAY DIFFRACTION
r_mcbond_it
2.786
0.687
1371
X-RAY DIFFRACTION
r_mcbond_other
2.786
0.687
1370
X-RAY DIFFRACTION
r_mcangle_it
3.396
1.032
1713
X-RAY DIFFRACTION
r_mcangle_other
3.395
1.032
1714
X-RAY DIFFRACTION
r_scbond_it
6.653
1.181
1447
X-RAY DIFFRACTION
r_scbond_other
6.652
1.184
1448
X-RAY DIFFRACTION
r_scangle_other
7.763
1.547
2088
X-RAY DIFFRACTION
r_long_range_B_refined
8.597
10.014
3245
X-RAY DIFFRACTION
r_long_range_B_other
8.582
9.588
3210
LS精密化 シェル
解像度: 1.62→1.662 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.303
172
-
Rwork
0.265
3232
-
obs
-
-
96.43 %
精密化 TLS
手法: refined / Origin x: 5.354 Å / Origin y: 46.933 Å / Origin z: 81.809 Å