構造決定の手法: 分子置換 開始モデル: SAD model 解像度: 2.37→44.462 Å / Cor.coef. Fo:Fc: 0.926 / Cor.coef. Fo:Fc free: 0.886 / SU B: 9.077 / SU ML: 0.213 / 交差検証法: FREE R-VALUE / ESU R: 0.42 / ESU R Free: 0.285 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Rfree
0.2803
1641
4.66 %
Rwork
0.2207
-
-
all
0.224
-
-
obs
-
35218
99.824 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å
原子変位パラメータ
Biso mean: 31.687 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.37 Å2
-0 Å2
0 Å2
2-
-
-0.983 Å2
-0 Å2
3-
-
-
-0.387 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.37→44.462 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
5770
0
4
207
5981
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.004
0.013
5932
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.017
5496
X-RAY DIFFRACTION
r_angle_refined_deg
1.33
1.648
8034
X-RAY DIFFRACTION
r_angle_other_deg
1.139
1.569
12740
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
7.168
5
710
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
31.792
20.559
322
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
17.146
15
1034
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
19.064
15
50
X-RAY DIFFRACTION
r_chiral_restr
0.058
0.2
766
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.02
6530
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
1332
X-RAY DIFFRACTION
r_nbd_refined
0.188
0.2
1103
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.181
0.2
5072
X-RAY DIFFRACTION
r_nbtor_refined
0.161
0.2
2733
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.076
0.2
2758
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.146
0.2
206
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_other
0.013
0.2
1
X-RAY DIFFRACTION
r_metal_ion_refined
0.088
0.2
2
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.148
0.2
18
X-RAY DIFFRACTION
r_nbd_other
0.21
0.2
65
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.112
0.2
7
X-RAY DIFFRACTION
r_mcbond_it
1.743
3.199
2846
X-RAY DIFFRACTION
r_mcbond_other
1.743
3.198
2845
X-RAY DIFFRACTION
r_mcangle_it
2.907
4.784
3548
X-RAY DIFFRACTION
r_mcangle_other
2.907
4.785
3549
X-RAY DIFFRACTION
r_scbond_it
2.002
3.518
3086
X-RAY DIFFRACTION
r_scbond_other
2.002
3.518
3086
X-RAY DIFFRACTION
r_scangle_it
3.443
5.137
4484
X-RAY DIFFRACTION
r_scangle_other
3.442
5.138
4485
X-RAY DIFFRACTION
r_lrange_it
5.196
36.099
6439
X-RAY DIFFRACTION
r_lrange_other
5.183
36.066
6416
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20