解像度: 2.28→20 Å / Rfactor Rfree error: 0.005 / Data cutoff high absF: 1000000 / Data cutoff low absF: 0.001 / 交差検証法: THROUGHOUT / σ(F): 2 / 詳細: BULK SOLVENT MODEL USED
Rfactor
反射数
%反射
Selection details
Rfree
0.265
2416
9.7 %
RANDOM
Rwork
0.234
-
-
-
obs
0.234
24917
95.8 %
-
原子変位パラメータ
Biso mean: 28 Å2
Refine analyze
Free
Obs
Luzzati coordinate error
0.34 Å
0.29 Å
Luzzati d res low
-
20 Å
Luzzati sigma a
0.29 Å
0.24 Å
精密化ステップ
サイクル: LAST / 解像度: 2.28→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4095
0
90
60
4245
拘束条件
Refine-ID
タイプ
Dev ideal
X-RAY DIFFRACTION
x_bond_d
0.011
X-RAY DIFFRACTION
x_bond_d_na
X-RAY DIFFRACTION
x_bond_d_prot
X-RAY DIFFRACTION
x_angle_d
X-RAY DIFFRACTION
x_angle_d_na
X-RAY DIFFRACTION
x_angle_d_prot
X-RAY DIFFRACTION
x_angle_deg
1.3
X-RAY DIFFRACTION
x_angle_deg_na
X-RAY DIFFRACTION
x_angle_deg_prot
X-RAY DIFFRACTION
x_dihedral_angle_d
27.6
X-RAY DIFFRACTION
x_dihedral_angle_d_na
X-RAY DIFFRACTION
x_dihedral_angle_d_prot
X-RAY DIFFRACTION
x_improper_angle_d
0.75
X-RAY DIFFRACTION
x_improper_angle_d_na
X-RAY DIFFRACTION
x_improper_angle_d_prot
X-RAY DIFFRACTION
x_mcbond_it
X-RAY DIFFRACTION
x_mcangle_it
X-RAY DIFFRACTION
x_scbond_it
X-RAY DIFFRACTION
x_scangle_it
Refine LS restraints NCS
NCS model details: RESTRAINTS
LS精密化 シェル
解像度: 2.28→2.36 Å / Rfactor Rfree error: 0.028 / Total num. of bins used: 10