ソフトウェア 名称 バージョン 分類 Blu-Iceデータ収集 REFMAC5.5.0110精密化 XDSデータ削減 XDSデータスケーリング REFMAC5.5.0110位相決定
精密化 構造決定の手法 : フーリエ合成開始モデル : PDB ENTRY 1O26解像度 : 1.76→29.35 Å / Cor.coef. Fo :Fc : 0.963 / Cor.coef. Fo :Fc free : 0.95 / SU B : 5.358 / SU ML : 0.085 / 交差検証法 : THROUGHOUT / σ(I) : 0 / ESU R : 0.121 / ESU R Free : 0.116 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.21466 4585 5 % RANDOM Rwork 0.17948 - - - obs 0.18123 86827 99.84 % - all - 86827 - -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.4 Å / 溶媒モデル : BABINET MODEL WITH MASK原子変位パラメータ Biso mean : 33.474 Å2 Baniso -1 Baniso -2 Baniso -3 1- 1.09 Å2 0 Å2 0 Å2 2- - -0.82 Å2 0 Å2 3- - - -0.26 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.76→29.35 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 7154 0 292 373 7819
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.017 0.022 7683 X-RAY DIFFRACTION r_bond_other_d0.001 0.02 5301 X-RAY DIFFRACTION r_angle_refined_deg1.684 1.993 10442 X-RAY DIFFRACTION r_angle_other_deg0.973 3 12752 X-RAY DIFFRACTION r_dihedral_angle_1_deg6.244 5 844 X-RAY DIFFRACTION r_dihedral_angle_2_deg34.548 22.361 377 X-RAY DIFFRACTION r_dihedral_angle_3_deg14.026 15 1292 X-RAY DIFFRACTION r_dihedral_angle_4_deg19.529 15 69 X-RAY DIFFRACTION r_chiral_restr0.104 0.2 1107 X-RAY DIFFRACTION r_gen_planes_refined0.008 0.021 8191 X-RAY DIFFRACTION r_gen_planes_other0.001 0.02 1726 X-RAY DIFFRACTION r_nbd_refinedX-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refinedX-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refinedX-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refinedX-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refinedX-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.91 1.5 4264 X-RAY DIFFRACTION r_mcbond_other0.273 1.5 1690 X-RAY DIFFRACTION r_mcangle_it1.588 2 6922 X-RAY DIFFRACTION r_scbond_it2.468 3 3419 X-RAY DIFFRACTION r_scangle_it3.784 4.5 3518 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 1.76→1.806 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.286 352 - Rwork 0.249 6262 - obs - - 99.92 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 4) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 0.9701 0.1451 0.8272 1.3885 1.1039 5.9414 -0.0201 -0.0802 0.1011 0.1156 -0.0557 0.0806 -0.2638 -0.4533 0.0758 0.0375 0.022 0.0042 0.0368 -0.0036 0.0194 27.711 61.253 123.403 2 1.4238 0.924 0.6477 3.7251 1.9288 4.0104 -0.0437 0.0785 -0.0118 -0.3994 0.0792 -0.4489 0.042 0.1639 -0.0356 0.0648 0.0046 0.0679 0.0291 0.0125 0.0784 44.225 45.642 97.74 3 1.2389 -0.1275 -1.2374 2.1538 1.4474 5.8456 -0.0121 0.0666 -0.1182 -0.2125 -0.0074 0.0499 0.1068 -0.3622 0.0195 0.035 -0.0182 -0.0101 0.0267 0.0038 0.0186 24.783 28.516 107.059 4 0.9008 -0.421 -0.3803 3.9459 2.91 4.5575 -0.0336 -0.1054 -0.0695 0.4512 0.1546 -0.3013 0.1964 0.3232 -0.121 0.0621 -0.0036 -0.0471 0.0586 0.0243 0.0506 40.87 40.052 134.196
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 A-1 - 33 2 X-RAY DIFFRACTION 1 A38 - 88 3 X-RAY DIFFRACTION 1 A94 - 217 4 X-RAY DIFFRACTION 2 B0 - 31 5 X-RAY DIFFRACTION 2 B37 - 91 6 X-RAY DIFFRACTION 2 B94 - 220 7 X-RAY DIFFRACTION 3 C1 - 88 8 X-RAY DIFFRACTION 3 C93 - 220 9 X-RAY DIFFRACTION 4 D0 - 32 10 X-RAY DIFFRACTION 4 D36 - 87 11 X-RAY DIFFRACTION 4 D91 - 215