温度: 277 K / 手法: バッチ法 / pH: 6.5 詳細: HEWL co-crystallized with cisplatin in 462.5 uL 0.05 M sodium acetate, pH 6.5, 462.5 uL 10% sodium chloride, and 75 uL DMSO, BATCH, temperature 277K
-
データ収集
回折
平均測定温度: 100 K
放射光源
由来: 回転陽極 / タイプ: RIGAKU MICROMAX-007 / 波長: 1.5418 Å
検出器
タイプ: RIGAKU RAXIS IV / 検出器: IMAGE PLATE / 日付: 2011年5月9日 / 詳細: Osmic Confocal Max-Flux, blue configuration
放射
モノクロメーター: confocal mirror optics / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
解像度: 3→28.16 Å / Cor.coef. Fo:Fc: 0.911 / Cor.coef. Fo:Fc free: 0.842 / SU B: 48.053 / SU ML: 0.499 / 交差検証法: THROUGHOUT / σ(F): 4 / σ(I): 2 / ESU R Free: 0.748 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES : REFINED INDIVIDUALLY
Rfactor
反射数
%反射
Selection details
Rfree
0.2795
73
4 %
RANDOM
Rwork
0.21399
-
-
-
obs
0.21684
1772
70.1 %
-
all
-
3234
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 17.811 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.22 Å2
0 Å2
0 Å2
2-
-
0.22 Å2
0 Å2
3-
-
-
-0.43 Å2
精密化ステップ
サイクル: LAST / 解像度: 3→28.16 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1001
0
48
31
1080
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.008
0.019
1064
X-RAY DIFFRACTION
r_bond_other_d
0.002
0.02
708
X-RAY DIFFRACTION
r_angle_refined_deg
1.173
1.933
1428
X-RAY DIFFRACTION
r_angle_other_deg
2.223
3.009
1685
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.001
5
128
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
37.751
23
50
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
16.27
15
166
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
14.599
15
11
X-RAY DIFFRACTION
r_chiral_restr
0.064
0.2
155
X-RAY DIFFRACTION
r_gen_planes_refined
0.003
0.02
1172
X-RAY DIFFRACTION
r_gen_planes_other
0.002
0.02
235
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 3→3.077 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.373
4
-
Rwork
0.24
145
-
obs
-
-
100 %
精密化 TLS
手法: refined / Origin x: -0.2933 Å / Origin y: -20.8895 Å / Origin z: 8.9398 Å