解像度: 2.7→56.78 Å / Cor.coef. Fo:Fc: 0.9413 / Cor.coef. Fo:Fc free: 0.9187 / SU R Cruickshank DPI: 0.346 / 交差検証法: THROUGHOUT / σ(F): 0 / SU R Blow DPI: 0.343 / SU Rfree Blow DPI: 0.245 / SU Rfree Cruickshank DPI: 0.248 詳細: IDEAL-DIST CONTACT TERM CONTACT SETUP. ALL ATOMS HAVE CCP4 ATOM TYPE FROM LIBRARY
Rfactor
反射数
%反射
Selection details
Rfree
0.2283
624
4.89 %
RANDOM
Rwork
0.1877
-
-
-
obs
0.1896
12759
99.98 %
-
原子変位パラメータ
Biso mean: 71.83 Å2
Baniso -1
Baniso -2
Baniso -3
1-
6.8061 Å2
0 Å2
0 Å2
2-
-
5.1108 Å2
0 Å2
3-
-
-
-11.9168 Å2
Refine analyze
Luzzati coordinate error obs: 0.341 Å
精密化ステップ
サイクル: LAST / 解像度: 2.7→56.78 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1982
0
78
21
2081
拘束条件
Refine-ID
タイプ
Dev ideal
数
Restraint function
Weight
X-RAY DIFFRACTION
t_bond_d
0.01
2098
HARMONIC
2
X-RAY DIFFRACTION
t_angle_deg
1.2
2821
HARMONIC
2
X-RAY DIFFRACTION
t_dihedral_angle_d
726
SINUSOIDAL
2
X-RAY DIFFRACTION
t_incorr_chiral_ct
X-RAY DIFFRACTION
t_pseud_angle
X-RAY DIFFRACTION
t_trig_c_planes
53
HARMONIC
2
X-RAY DIFFRACTION
t_gen_planes
306
HARMONIC
5
X-RAY DIFFRACTION
t_it
2098
HARMONIC
20
X-RAY DIFFRACTION
t_nbd
X-RAY DIFFRACTION
t_omega_torsion
2.78
X-RAY DIFFRACTION
t_other_torsion
19.85
X-RAY DIFFRACTION
t_improper_torsion
X-RAY DIFFRACTION
t_chiral_improper_torsion
272
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_sum_occupancies
X-RAY DIFFRACTION
t_utility_distance
X-RAY DIFFRACTION
t_utility_angle
X-RAY DIFFRACTION
t_utility_torsion
X-RAY DIFFRACTION
t_ideal_dist_contact
2292
SEMIHARMONIC
4
LS精密化 シェル
解像度: 2.7→2.96 Å / Total num. of bins used: 6
Rfactor
反射数
%反射
Rfree
0.2819
173
5.77 %
Rwork
0.2002
2827
-
all
0.2048
3000
-
obs
-
-
99.98 %
精密化 TLS
手法: refined / Origin x: 5.0498 Å / Origin y: 32.5965 Å / Origin z: 16.9897 Å