N-ACETYL-D-GLUCOSAMINE (NAG): COVALENTLY BOUND TO A-ASN362, A-ASN380 AND B-ASN362 RESPECTIVELY, BY ...N-ACETYL-D-GLUCOSAMINE (NAG): COVALENTLY BOUND TO A-ASN362, A-ASN380 AND B-ASN362 RESPECTIVELY, BY N-GLYCOSIDIC LINKAGES
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実験情報
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実験
実験
手法: X線回折 / 使用した結晶の数: 1
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試料調製
結晶
マシュー密度: 2.65 Å3/Da / 溶媒含有率: 53.6 % / 解説: NONE
結晶化
pH: 7.5 詳細: 0.2 M SODIUM NITRATE, 0.1 M BIS-TRIS PROPANE PH 7.5, 20% PEG 3350
解像度: 2→43.561 Å / SU ML: 0.53 / σ(F): 1.34 / 位相誤差: 20.19 / 立体化学のターゲット値: ML 詳細: THE FIRST 8 AMINO ACIDS OF THE SAMPLE (EAEAYVEF) CORRESPOND TO A PURIFICATION TAG. THIS REGION IS MAINLY DISORDERED IN THE CRYSTAL.
Rfactor
反射数
%反射
Rfree
0.2059
4204
5 %
Rwork
0.1675
-
-
obs
0.1694
84172
99.99 %
溶媒の処理
減衰半径: 0.98 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL / Bsol: 41.224 Å2 / ksol: 0.328 e/Å3
原子変位パラメータ
Baniso -1
Baniso -2
Baniso -3
1-
1.6444 Å2
0 Å2
0 Å2
2-
-
1.6444 Å2
0 Å2
3-
-
-
-3.2889 Å2
精密化ステップ
サイクル: LAST / 解像度: 2→43.561 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
8251
0
212
765
9228
拘束条件
Refine-ID
タイプ
Dev ideal
数
X-RAY DIFFRACTION
f_bond_d
0.008
8743
X-RAY DIFFRACTION
f_angle_d
1.051
11877
X-RAY DIFFRACTION
f_dihedral_angle_d
14.118
3136
X-RAY DIFFRACTION
f_chiral_restr
0.073
1323
X-RAY DIFFRACTION
f_plane_restr
0.005
1527
LS精密化 シェル
解像度 (Å)
Rfactor Rfree
Num. reflection Rfree
Rfactor Rwork
Num. reflection Rwork
Refine-ID
% reflection obs (%)
2-2.0228
0.2975
127
0.2697
2662
X-RAY DIFFRACTION
100
2.0228-2.0466
0.2755
144
0.2378
2653
X-RAY DIFFRACTION
100
2.0466-2.0715
0.2775
129
0.2073
2656
X-RAY DIFFRACTION
100
2.0715-2.0977
0.2627
131
0.2082
2655
X-RAY DIFFRACTION
100
2.0977-2.1253
0.2495
144
0.1953
2690
X-RAY DIFFRACTION
100
2.1253-2.1545
0.236
131
0.1936
2628
X-RAY DIFFRACTION
100
2.1545-2.1852
0.2462
130
0.1888
2669
X-RAY DIFFRACTION
100
2.1852-2.2178
0.252
150
0.1815
2663
X-RAY DIFFRACTION
100
2.2178-2.2525
0.2592
143
0.1773
2674
X-RAY DIFFRACTION
100
2.2525-2.2894
0.2702
153
0.1822
2617
X-RAY DIFFRACTION
100
2.2894-2.3289
0.2091
119
0.1708
2647
X-RAY DIFFRACTION
100
2.3289-2.3713
0.1848
127
0.1666
2686
X-RAY DIFFRACTION
100
2.3713-2.4169
0.2435
139
0.1652
2657
X-RAY DIFFRACTION
100
2.4169-2.4662
0.2238
134
0.1709
2682
X-RAY DIFFRACTION
100
2.4662-2.5198
0.2263
148
0.1689
2636
X-RAY DIFFRACTION
100
2.5198-2.5784
0.2329
143
0.1649
2630
X-RAY DIFFRACTION
100
2.5784-2.6429
0.2107
144
0.1602
2661
X-RAY DIFFRACTION
100
2.6429-2.7143
0.2291
138
0.1572
2665
X-RAY DIFFRACTION
100
2.7143-2.7942
0.1967
163
0.1625
2636
X-RAY DIFFRACTION
100
2.7942-2.8844
0.2022
138
0.1516
2672
X-RAY DIFFRACTION
100
2.8844-2.9874
0.1877
134
0.1499
2690
X-RAY DIFFRACTION
100
2.9874-3.107
0.197
129
0.1591
2664
X-RAY DIFFRACTION
100
3.107-3.2484
0.1742
149
0.1548
2663
X-RAY DIFFRACTION
100
3.2484-3.4196
0.2005
131
0.1589
2675
X-RAY DIFFRACTION
100
3.4196-3.6337
0.188
149
0.1595
2656
X-RAY DIFFRACTION
100
3.6337-3.9141
0.1969
146
0.1556
2687
X-RAY DIFFRACTION
100
3.9141-4.3077
0.1774
144
0.1487
2681
X-RAY DIFFRACTION
100
4.3077-4.9303
0.1777
154
0.1365
2675
X-RAY DIFFRACTION
100
4.9303-6.2088
0.1989
141
0.1816
2699
X-RAY DIFFRACTION
100
6.2088-43.571
0.1948
152
0.1953
2739
X-RAY DIFFRACTION
100
精密化 TLS
手法: refined / Origin x: 31.4231 Å / Origin y: 0.2326 Å / Origin z: 28.147 Å