構造決定の手法: 分子置換 / 解像度: 2.03→84 Å / Cor.coef. Fo:Fc: 0.953 / Cor.coef. Fo:Fc free: 0.929 / SU B: 9.493 / SU ML: 0.116 / 交差検証法: THROUGHOUT / ESU R: 0.174 / ESU R Free: 0.164 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.25788
1361
5 %
RANDOM
Rwork
0.21842
-
-
-
all
0.25788
26674
-
-
obs
0.22041
25674
96.25 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 36.069 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.18 Å2
0.09 Å2
0 Å2
2-
-
0.18 Å2
0 Å2
3-
-
-
-0.27 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.03→84 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2190
0
13
152
2355
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.029
0.021
2267
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
2.201
1.953
3077
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.283
5
268
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.234
23.136
118
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
15.609
15
378
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
22.5
15
21
X-RAY DIFFRACTION
r_chiral_restr
0.17
0.2
327
X-RAY DIFFRACTION
r_gen_planes_refined
0.012
0.021
1763
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.391
1.5
1335
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
2.415
2
2164
X-RAY DIFFRACTION
r_scbond_it
3.785
3
932
X-RAY DIFFRACTION
r_scangle_it
5.768
4.5
912
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.029→2.082 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.284
72
-
Rwork
0.35
1426
-
obs
-
-
72.9 %
精密化 TLS
手法: refined / Origin x: -7.8068 Å / Origin y: -40.4745 Å / Origin z: -0.3095 Å