| ソフトウェア | | 名称 | バージョン | 分類 |
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| PHASES | | 位相決定 | X-PLOR | 3 | モデル構築 | X-PLOR | 3 | 精密化 | | bioteX | | データ削減 | | bioteX | | データスケーリング | X-PLOR | 3 | 位相決定 |
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| 精密化 | 構造決定の手法: 多重同系置換 / 解像度: 2.4→10 Å / Rfactor Rfree error: 0.0025 / Data cutoff high absF: 20000 / Data cutoff low absF: 0.001 / Isotropic thermal model: 0 / 交差検証法: THROUGHOUT / σ(F): 2
| Rfactor | 反射数 | %反射 | Selection details |
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| Rfree | 0.237 | 848 | 10 % | RANDOM |
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| Rwork | 0.195 | - | - | - |
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| obs | 0.195 | 9017 | 92.1 % | - |
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| 原子変位パラメータ | Biso mean: 24.5 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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| 1- | 0 Å2 | 0 Å2 | 0 Å2 |
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| 2- | - | 0 Å2 | 0 Å2 |
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| 3- | - | - | 0 Å2 |
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| Refine analyze | | Free | Obs |
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| Luzzati coordinate error | 0 Å | 0 Å |
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| Luzzati d res low | - | 7 Å |
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| Luzzati sigma a | 0 Å | 0 Å |
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| 精密化ステップ | サイクル: LAST / 解像度: 2.4→10 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 1718 | 0 | 0 | 38 | 1756 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_bond_d| 0.017 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg| 3.7 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d| 1.21 | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it | | X-RAY DIFFRACTION | x_mcangle_it | | X-RAY DIFFRACTION | x_scbond_it | | X-RAY DIFFRACTION | x_scangle_it | | | | | | | | | | | | | | | | | | | |
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| LS精密化 シェル | 解像度: 2.4→2.5 Å / Rfactor Rfree error: 0.016 / Total num. of bins used: 8
| Rfactor | 反射数 | %反射 |
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| Rfree | 0.283 | 16 | 5 % |
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| Rwork | 0.239 | 325 | - |
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| obs | - | - | 80.1 % |
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| Xplor file | | Refine-ID | Serial no | Param file | Topol file |
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| X-RAY DIFFRACTION | 1 | PARAM19X.PROTOPH19X.PRO| X-RAY DIFFRACTION | 2 | | | | |
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| 精密化 | *PLUS 最高解像度: 2.4 Å / 最低解像度: 7 Å / Num. reflection obs: 8508 / Rfactor obs: 0.195 / Rfactor Rfree: 0.237 / Rfactor Rwork: 0.195 |
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| 溶媒の処理 | *PLUS |
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| 原子変位パラメータ | *PLUS |
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| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_bond_d| 0.015 | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_deg| 1.21 | | | |
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| LS精密化 シェル | *PLUS Rfactor Rfree: 0.283 / Rfactor Rwork: 0.239 / Rfactor obs: 0.239 |
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