構造決定の手法: 分子置換 / 解像度: 2.08→30.57 Å / Cor.coef. Fo:Fc: 0.945 / Cor.coef. Fo:Fc free: 0.908 / SU B: 9.713 / SU ML: 0.115 / 交差検証法: THROUGHOUT / ESU R Free: 0.169 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.2362
1320
5 %
RANDOM
Rwork
0.18258
-
-
-
all
0.18531
26205
-
-
obs
0.18531
24885
96.72 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 27.109 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0 Å2
0 Å2
-0.04 Å2
2-
-
-0.02 Å2
0 Å2
3-
-
-
0.01 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.08→30.57 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2371
0
54
326
2751
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.014
0.022
2491
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.481
1.969
3384
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.684
5
309
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.935
24.364
110
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.856
15
395
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
16.42
15
12
X-RAY DIFFRACTION
r_chiral_restr
0.1
0.2
380
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.021
1903
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.742
1.5
1524
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.382
2
2467
X-RAY DIFFRACTION
r_scbond_it
2.21
3
967
X-RAY DIFFRACTION
r_scangle_it
3.424
4.5
915
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.08→2.136 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.367
69
-
Rwork
0.283
1395
-
obs
-
-
72.98 %
精密化 TLS
手法: refined / Origin x: -7.3999 Å / Origin y: 24.4162 Å / Origin z: 10.8584 Å