ソフトウェア 名称 バージョン 分類 REFMAC5.2.0019精密化 CNS精密化 CrystalClearデータ収集 CrystalClearデータ削減 CrystalClearデータスケーリング CNS位相決定
精密化 構造決定の手法 : 分子置換開始モデル : PDB ENTRY 1U1I解像度 : 1.9→68.04 Å / Cor.coef. Fo :Fc : 0.968 / Cor.coef. Fo :Fc free : 0.945 / SU B : 8.088 / SU ML : 0.123 / 交差検証法 : THROUGHOUT / ESU R : 0.167 / ESU R Free : 0.157 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.22917 1512 5 % RANDOM Rwork 0.17462 - - - obs 0.17733 28479 96.81 % -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : MASK原子変位パラメータ Biso mean : 24.886 Å2 Baniso -1 Baniso -2 Baniso -3 1- 0.04 Å2 0 Å2 0 Å2 2- - 2.38 Å2 0 Å2 3- - - -2.43 Å2
Refine analyze Luzzati sigma a obs : 0.167 Å精密化ステップ サイクル : LAST / 解像度 : 1.9→68.04 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 3080 0 97 234 3411
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.015 0.022 3346 X-RAY DIFFRACTION r_bond_other_dX-RAY DIFFRACTION r_angle_refined_deg1.533 1.999 4540 X-RAY DIFFRACTION r_angle_other_degX-RAY DIFFRACTION r_dihedral_angle_1_deg5.61 5 421 X-RAY DIFFRACTION r_dihedral_angle_2_deg31.8 24.514 144 X-RAY DIFFRACTION r_dihedral_angle_3_deg15.249 15 586 X-RAY DIFFRACTION r_dihedral_angle_4_deg14.728 15 13 X-RAY DIFFRACTION r_chiral_restr0.099 0.2 490 X-RAY DIFFRACTION r_gen_planes_refined0.006 0.02 2484 X-RAY DIFFRACTION r_gen_planes_otherX-RAY DIFFRACTION r_nbd_refined0.213 0.2 1670 X-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refined0.305 0.2 2279 X-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refined0.163 0.2 224 X-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refined0.177 0.2 140 X-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refined0.213 0.2 24 X-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.66 1.5 1992 X-RAY DIFFRACTION r_mcbond_otherX-RAY DIFFRACTION r_mcangle_it1.16 2 3213 X-RAY DIFFRACTION r_scbond_it2.115 3 1398 X-RAY DIFFRACTION r_scangle_it3.141 4.5 1311 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 1.895→1.944 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.3 114 - Rwork 0.268 1955 - obs - - 91.47 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 5) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 1.5233 0.0657 -0.1216 0.5721 -0.0973 1.4061 0.0885 0.0846 -0.1272 -0.0948 -0.0334 0.0575 0.4795 0.2641 -0.0551 0.0511 0.138 -0.0075 -0.0847 0.0001 -0.0646 17.8668 17.7912 9.6326 2 0.5508 -0.283 0.4268 0.5261 -0.1584 2.3344 -0.0086 -0.1466 -0.0621 0.0549 0.0105 0.0155 0.135 0.1195 -0.002 -0.0212 0.0794 -0.0036 -0.0724 0.0175 -0.0635 18.4342 22.2607 27.5325 3 0.0041 -0.016 -0.0281 0.3936 -0.2093 0.498 0.037 0.069 0.0124 0.0536 -0.0738 0.0033 -0.0103 0.3079 0.0368 -0.0358 0.0146 -0.0098 0.0597 0.0276 -0.0162 21.268 37.8647 15.562 4 0.4815 -0.4683 -0.4692 1.781 -1.4284 3.1369 0.0351 -0.0252 0.0941 0.4077 -0.0459 0.0332 -0.1475 0.2472 0.0108 -0.0246 0.0095 -0.0417 -0.0544 0.0159 0.0182 10.9286 39.4128 19.6344 5 0.1233 -0.1636 0.0847 0.5005 -0.3338 0.9477 0.0486 0.0376 0.0513 0.0411 -0.1217 -0.0051 0.0041 0.3073 0.0731 -0.0514 0.012 -0.0037 0.0256 0.0208 -0.0368 19.0413 38.4723 8.8479
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 A1 - 75 2 X-RAY DIFFRACTION 2 A76 - 188 3 X-RAY DIFFRACTION 3 A189 - 258 4 X-RAY DIFFRACTION 4 A259 - 286 5 X-RAY DIFFRACTION 5 A287 - 392