モノクロメーター: SI / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.9793 Å / 相対比: 1
反射
解像度: 2.2→30 Å / Num. obs: 20957 / % possible obs: 99.9 % / Observed criterion σ(I): 0 / 冗長度: 19.5 % / Biso Wilson estimate: 37.3 Å2 / Rmerge(I) obs: 0.097 / Rsym value: 0.097 / Net I/σ(I): 14.2
反射 シェル
解像度: 2.2→2.24 Å / 冗長度: 19.3 % / Rmerge(I) obs: 0.553 / Mean I/σ(I) obs: 3 / Rsym value: 0.553 / % possible all: 100
-
解析
ソフトウェア
名称
バージョン
分類
NB
DENZO
データ削減
SCALEPACK
データスケーリング
REFMAC
精密化
PDB_EXTRACT
3.1
データ抽出
HKL-2000
データ削減
SHELXCD
位相決定
SHELXE
モデル構築
精密化
構造決定の手法: 単波長異常分散 / 解像度: 2.2→20 Å / Cor.coef. Fo:Fc: 0.946 / Cor.coef. Fo:Fc free: 0.918 / Occupancy max: 1 / Occupancy min: 1 / SU B: 12.061 / SU ML: 0.143 / SU R Cruickshank DPI: 0.248 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R Free: 0.21 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES: RESIDUAL ONLY
Rfactor
反射数
%反射
Selection details
Rfree
0.254
1072
5.1 %
RANDOM
Rwork
0.202
-
-
-
obs
0.205
20893
99.8 %
-
all
-
20935
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 58.948 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.49 Å2
0 Å2
0 Å2
2-
-
-0.49 Å2
0 Å2
3-
-
-
0.98 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.2→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2640
0
8
54
2702
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.013
0.022
2688
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1822
X-RAY DIFFRACTION
r_angle_refined_deg
1.381
1.986
3640
X-RAY DIFFRACTION
r_angle_other_deg
0.907
3
4440
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.826
5
354
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.841
23
100
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
14.666
15
445
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
17.179
15
23
X-RAY DIFFRACTION
r_chiral_restr
0.077
0.2
427
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.021
2997
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
530
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.715
1.5
1767
X-RAY DIFFRACTION
r_mcbond_other
0.152
1.5
727
X-RAY DIFFRACTION
r_mcangle_it
1.312
2
2809
X-RAY DIFFRACTION
r_scbond_it
2.083
3
921
X-RAY DIFFRACTION
r_scangle_it
3.165
4.5
831
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.2→2.26 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.258
82
-
Rwork
0.224
1422
-
obs
-
-
99.87 %
精密化 TLS
手法: refined / Origin x: 31.188 Å / Origin y: 12.51 Å / Origin z: 12.933 Å