構造決定の手法: 単波長異常分散 / 解像度: 1.956→33.18 Å / Cor.coef. Fo:Fc: 0.954 / Cor.coef. Fo:Fc free: 0.936 / SU B: 6.735 / SU ML: 0.089 / 交差検証法: THROUGHOUT / ESU R: 0.147 / ESU R Free: 0.144 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.24295
2327
5.1 %
RANDOM
Rwork
0.19895
-
-
-
obs
0.20111
43564
99.22 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 52.429 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.67 Å2
0 Å2
0 Å2
2-
-
-1.81 Å2
0 Å2
3-
-
-
1.14 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.956→33.18 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
3683
0
0
168
3851
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.027
0.022
3768
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
2.068
1.928
5113
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.898
5
456
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
38.785
24.596
198
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
17.416
15
630
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
19.05
15
20
X-RAY DIFFRACTION
r_chiral_restr
0.183
0.2
561
X-RAY DIFFRACTION
r_gen_planes_refined
0.011
0.02
2908
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.672
1.5
2269
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
2.901
2
3668
X-RAY DIFFRACTION
r_scbond_it
3.685
3
1499
X-RAY DIFFRACTION
r_scangle_it
5.774
4.5
1445
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.956→2.007 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.274
169
-
Rwork
0.243
3000
-
obs
-
-
93.7 %
精密化 TLS
手法: refined / Origin x: 10.7173 Å / Origin y: 34.7116 Å / Origin z: 49.7214 Å