ソフトウェア 名称 バージョン 分類 MAR345データ収集 MLPHARE位相決定 REFMAC5.5.0072精密化 HKL-2000データ削減 HKL-2000データスケーリング
精密化 構造決定の手法 : 単波長異常分散 / 解像度 : 2.2→29.55 Å / Cor.coef. Fo :Fc : 0.949 / Cor.coef. Fo :Fc free : 0.925 / SU B : 15.931 / SU ML : 0.18 / TLS residual ADP flag : LIKELY RESIDUAL / 交差検証法 : THROUGHOUT / ESU R : 0.334 / ESU R Free : 0.243 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.26268 526 4.8 % RANDOM Rwork 0.21448 - - - obs 0.21681 10478 91.78 % - all - 10478 - -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.4 Å / 溶媒モデル : BABINET MODEL WITH MASK原子変位パラメータ Biso mean : 48.953 Å2 Baniso -1 Baniso -2 Baniso -3 1- 2.84 Å2 0 Å2 0 Å2 2- - -1.48 Å2 0 Å2 3- - - -1.36 Å2
精密化ステップ サイクル : LAST / 解像度 : 2.2→29.55 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 971 623 0 97 1691
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.008 0.021 1695 X-RAY DIFFRACTION r_bond_other_dX-RAY DIFFRACTION r_angle_refined_deg1.348 2.394 2400 X-RAY DIFFRACTION r_angle_other_degX-RAY DIFFRACTION r_dihedral_angle_1_deg6.075 5 116 X-RAY DIFFRACTION r_dihedral_angle_2_deg21.052 21.02 49 X-RAY DIFFRACTION r_dihedral_angle_3_deg14.458 15 179 X-RAY DIFFRACTION r_dihedral_angle_4_deg17.111 15 11 X-RAY DIFFRACTION r_chiral_restr0.073 0.2 245 X-RAY DIFFRACTION r_gen_planes_refined0.005 0.02 1090 X-RAY DIFFRACTION r_gen_planes_otherX-RAY DIFFRACTION r_nbd_refinedX-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refinedX-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refinedX-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refinedX-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refinedX-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.617 1.5 585 X-RAY DIFFRACTION r_mcbond_otherX-RAY DIFFRACTION r_mcangle_it1.184 2 927 X-RAY DIFFRACTION r_scbond_it1.127 3 1110 X-RAY DIFFRACTION r_scangle_it1.805 4.5 1473 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 2.2→2.262 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.422 27 - Rwork 0.279 581 - obs - - 69.25 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 4) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 1.4607 -0.237 3.5098 0.5445 0.0132 9.6832 0.1729 0.0021 -0.12 0.0889 0.0412 0.1298 0.4024 0.0549 -0.2141 0.0926 -0.0118 0.0417 0.0398 -0.024 0.068 14.4456 -5.615 -20.314 2 1.1839 -0.343 2.3768 0.2593 -1.569 9.8892 -0.0328 0.0887 0.0878 -0.0185 0.0668 0.0115 0.2432 -0.2973 -0.034 0.111 -0.0423 0.0154 0.0943 -0.0338 0.1039 9.9642 -1.0769 -27.3083 3 2.8765 -1.0093 -0.6642 4.8339 1.8028 5.3028 0.0414 0.1707 0.1645 -0.1823 0.0789 -0.9101 -0.1362 0.6339 -0.1204 0.1512 -0.0507 0.0709 0.1328 -0.0298 0.2627 27.6921 -1.3296 -13.2621 4 4.705 0.5541 -0.6124 2.8098 0.6006 3.9339 -0.1899 0.189 0.4752 0.2997 0.1868 -0.0628 -0.3009 0.2616 0.0031 0.1029 -0.0353 -0.0221 0.0643 -0.0144 0.0904 13.7092 12.1749 -33.7973
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 A62 - 123 2 X-RAY DIFFRACTION 2 B62 - 117 3 X-RAY DIFFRACTION 3 C1 - 8 4 X-RAY DIFFRACTION 3 D1 - 7 5 X-RAY DIFFRACTION 4 W1 - 8 6 X-RAY DIFFRACTION 4 X1 - 8