ソフトウェア | 名称 | バージョン | 分類 |
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HKL-2000 | | データ収集 | MOLREP | | 位相決定 | REFMAC | 5.2.0019精密化 | HKL-2000 | | データ削減 | HKL-2000 | | データスケーリング | |
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精密化 | 構造決定の手法: 分子置換 開始モデル: PDB entry 3CKA 解像度: 2.49→20 Å / Cor.coef. Fo:Fc: 0.914 / Cor.coef. Fo:Fc free: 0.876 / SU B: 28.187 / SU ML: 0.281 / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R: 1.556 / ESU R Free: 0.379 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.29875 | 2264 | 10.1 % | RANDOM |
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Rwork | 0.26211 | - | - | - |
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obs | 0.26578 | 20097 | 98.67 % | - |
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all | - | 20097 | - | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK |
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原子変位パラメータ | Biso mean: 38.185 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 2.96 Å2 | 0 Å2 | 0.02 Å2 |
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2- | - | -5.67 Å2 | 0 Å2 |
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3- | - | - | 2.71 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 2.49→20 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 4776 | 0 | 18 | 0 | 4794 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.013 | 0.022 | 4831 | X-RAY DIFFRACTION | r_bond_other_d | | | X-RAY DIFFRACTION | r_angle_refined_deg1.559 | 1.987 | 6482 | X-RAY DIFFRACTION | r_angle_other_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg6.783 | 5 | 630 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg38.83 | 26.667 | 174 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg20.616 | 15 | 962 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg15.557 | 15 | 10 | X-RAY DIFFRACTION | r_chiral_restr0.111 | 0.2 | 794 | X-RAY DIFFRACTION | r_gen_planes_refined0.004 | 0.02 | 3370 | X-RAY DIFFRACTION | r_gen_planes_other | | | X-RAY DIFFRACTION | r_nbd_refined0.253 | 0.2 | 1771 | X-RAY DIFFRACTION | r_nbd_other | | | X-RAY DIFFRACTION | r_nbtor_refined0.305 | 0.2 | 3217 | X-RAY DIFFRACTION | r_nbtor_other | | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.149 | 0.2 | 179 | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_metal_ion_refined | | | X-RAY DIFFRACTION | r_metal_ion_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.241 | 0.2 | 83 | X-RAY DIFFRACTION | r_symmetry_vdw_other | | | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.153 | 0.2 | 11 | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_refined | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_other | | | X-RAY DIFFRACTION | r_mcbond_it0.834 | 1.5 | 3194 | X-RAY DIFFRACTION | r_mcbond_other | | | X-RAY DIFFRACTION | r_mcangle_it1.121 | 2 | 5028 | X-RAY DIFFRACTION | r_scbond_it1.698 | 3 | 1795 | X-RAY DIFFRACTION | r_scangle_it2.846 | 4.5 | 1454 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.49→2.558 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.447 | 151 | - |
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Rwork | 0.356 | 1418 | - |
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obs | - | - | 95.96 % |
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