ソフトウェア | 名称 | 分類 |
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X-PLOR | モデル構築 | X-PLOR | 精密化 | DENZO | データ削減 | X-PLOR | 位相決定 |
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精密化 | 開始モデル: PIECE OF UDJ031 解像度: 2.4→8 Å / σ(F): 2 / | Rfactor | 反射数 | %反射 |
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Rwork | 0.203 | - | - |
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obs | 0.203 | 1177 | 96 % |
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Refine Biso | クラス | Refine-ID | 詳細 | Treatment |
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ALL ATOMSX-RAY DIFFRACTION | TFisotropicALL WATERSX-RAY DIFFRACTION | TFisotropic | | | | | |
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精密化ステップ | サイクル: LAST / 解像度: 2.4→8 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 0 | 205 | 1 | 66 | 272 |
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拘束条件 | Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | x_bond_d0.02 | X-RAY DIFFRACTION | x_bond_d_na | X-RAY DIFFRACTION | x_bond_d_prot | X-RAY DIFFRACTION | x_angle_d | X-RAY DIFFRACTION | x_angle_d_na | X-RAY DIFFRACTION | x_angle_d_prot | X-RAY DIFFRACTION | x_angle_deg2.8 | X-RAY DIFFRACTION | x_angle_deg_na | X-RAY DIFFRACTION | x_angle_deg_prot | X-RAY DIFFRACTION | x_dihedral_angle_d22.1 | X-RAY DIFFRACTION | x_dihedral_angle_d_na | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | X-RAY DIFFRACTION | x_improper_angle_d5.1 | X-RAY DIFFRACTION | x_improper_angle_d_na | X-RAY DIFFRACTION | x_improper_angle_d_prot | X-RAY DIFFRACTION | x_mcbond_it | X-RAY DIFFRACTION | x_mcangle_it | X-RAY DIFFRACTION | x_scbond_it | X-RAY DIFFRACTION | x_scangle_it | | | | | | | | | | | | | | | | | | | |
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Xplor file | Serial no: 1 / Param file: NDB_TOPOLOGY_FILE.DNA / Topol file: NDB_PARAMETER_FILE.DNA |
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ソフトウェア | *PLUS 名称: X-PLOR / 分類: refinement |
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精密化 | *PLUS 最高解像度: 2.4 Å / 最低解像度: 8 Å / σ(F): 2 / Rfactor obs: 0.195 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | x_bond_d0.02 | X-RAY DIFFRACTION | x_angle_deg2.8 | X-RAY DIFFRACTION | x_dihedral_angle_d | X-RAY DIFFRACTION | x_dihedral_angle_deg22.1 | X-RAY DIFFRACTION | x_improper_angle_d | X-RAY DIFFRACTION | x_improper_angle_deg5.1 | | | | | | |
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