ソフトウェア 名称 バージョン 分類 REFMAC5.2.0019精密化 SBC-Collectデータ収集 HKL-3000データ削減 HKL-3000データスケーリング HKL-3000位相決定
精密化 構造決定の手法 : 単波長異常分散 / 解像度 : 1.76→30.03 Å / Cor.coef. Fo :Fc : 0.954 / Cor.coef. Fo :Fc free : 0.932 / SU B : 4.041 / SU ML : 0.069 / TLS residual ADP flag : LIKELY RESIDUAL / 交差検証法 : THROUGHOUT / σ(F) : 0 / ESU R : 0.119 / ESU R Free : 0.116 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.20926 1285 5.1 % RANDOM Rwork 0.17009 - - - obs 0.17215 23845 99.38 % - all - 23845 - -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : MASK原子変位パラメータ Biso mean : 15.8 Å2 Baniso -1 Baniso -2 Baniso -3 1- -0.78 Å2 0 Å2 0 Å2 2- - 0.65 Å2 0 Å2 3- - - 0.13 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.76→30.03 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 1927 0 4 276 2207
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.012 0.022 2024 X-RAY DIFFRACTION r_bond_other_dX-RAY DIFFRACTION r_angle_refined_deg1.309 1.966 2747 X-RAY DIFFRACTION r_angle_other_degX-RAY DIFFRACTION r_dihedral_angle_1_deg4.945 5 256 X-RAY DIFFRACTION r_dihedral_angle_2_deg38.824 26.106 113 X-RAY DIFFRACTION r_dihedral_angle_3_deg14.244 15 295 X-RAY DIFFRACTION r_dihedral_angle_4_deg11.017 15 6 X-RAY DIFFRACTION r_chiral_restr0.091 0.2 294 X-RAY DIFFRACTION r_gen_planes_refined0.005 0.02 1624 X-RAY DIFFRACTION r_gen_planes_otherX-RAY DIFFRACTION r_nbd_refined0.189 0.2 959 X-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refined0.306 0.2 1425 X-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refined0.17 0.2 226 X-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refined0.22 0.2 78 X-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refined0.131 0.2 26 X-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.877 1.5 1262 X-RAY DIFFRACTION r_mcbond_otherX-RAY DIFFRACTION r_mcangle_it1.207 2 1966 X-RAY DIFFRACTION r_scbond_it2.339 3 843 X-RAY DIFFRACTION r_scangle_it3.504 4.5 772 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 1.76→1.806 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.239 97 - Rwork 0.179 1679 - obs - - 97.85 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 4) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 8.4717 7.4595 3.9805 6.5682 3.5049 1.8703 -0.1891 0.9843 0.1372 -0.2752 0.3705 -0.0052 -0.2088 0.2825 -0.1814 0.0305 -0.0104 0.0096 0.0576 0.0346 0.0614 33.0506 76.8245 9.2534 2 0.5243 -0.0544 0.2862 0.6018 0.1465 1.3141 0.0341 0.0311 -0.024 0.0288 -0.0053 -0.0347 0.0403 0.0083 -0.0287 -0.0246 -0.0031 0.0083 -0.0195 -0.0057 -0.0233 34.5892 59.6766 10.1603 3 3.3781 -2.4489 0.1326 2.5328 0.1123 0.6643 0.0076 -0.1062 -0.0127 -0.0329 -0.0159 0.1526 0.0519 -0.0624 0.0083 -0.0242 -0.031 0.0144 -0.0277 -0.0072 -0.0281 27.2985 45.0495 31.3068 4 0.9555 -0.2789 -0.3078 0.5331 0.1809 0.5698 -0.0121 0.0281 0.0418 0.0312 -0.0033 -0.0125 -0.0079 -0.0457 0.0154 -0.0171 0.0002 -0.0059 -0.0175 0.0033 -0.0238 26.9692 61.7499 33.95
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Label asym-ID Auth seq-ID Label seq-ID 1 X-RAY DIFFRACTION 1 AA3 - 24 6 - 27 2 X-RAY DIFFRACTION 2 AA25 - 122 28 - 125 3 X-RAY DIFFRACTION 3 BB1 - 24 4 - 27 4 X-RAY DIFFRACTION 4 BB25 - 122 28 - 125