ソフトウェア | 名称 | バージョン | 分類 |
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REFMAC | 5.2.0019精密化 | SBC-Collect | | データ収集 | HKL-3000 | | データ収集 | HKL-3000 | | データ削減 | HKL-3000 | | データスケーリング | HKL-3000 | | 位相決定 | SHELXCD | | 位相決定 | SHELXD | | 位相決定 | MLPHARE | | 位相決定 | RESOLVE | | 位相決定 | ARP/wARP | | モデル構築 | |
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精密化 | 構造決定の手法: 単波長異常分散 / 解像度: 1.63→40.3 Å / Cor.coef. Fo:Fc: 0.967 / Cor.coef. Fo:Fc free: 0.949 / SU B: 4.283 / SU ML: 0.075 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.116 / ESU R Free: 0.116 立体化学のターゲット値: MAXIMUM LIKELIHOOD WITH PHASES
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.216 | 4020 | 9.9 % | RANDOM |
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Rwork | 0.171 | - | - | - |
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all | 0.175 | 36437 | - | - |
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obs | 0.175 | 36437 | 93.46 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK |
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原子変位パラメータ | Biso mean: 26.495 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | -2.12 Å2 | 0 Å2 | -0.15 Å2 |
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2- | - | 1.18 Å2 | 0 Å2 |
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3- | - | - | 0.85 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 1.63→40.3 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 2710 | 0 | 14 | 528 | 3252 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.016 | 0.021 | 3075 | X-RAY DIFFRACTION | r_bond_other_d | | | X-RAY DIFFRACTION | r_angle_refined_deg1.596 | 1.921 | 4221 | X-RAY DIFFRACTION | r_angle_other_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg9.531 | 5 | 380 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg33.861 | 22.982 | 171 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg13.934 | 15 | 469 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg15.625 | 15 | 27 | X-RAY DIFFRACTION | r_chiral_restr0.119 | 0.2 | 430 | X-RAY DIFFRACTION | r_gen_planes_refined0.008 | 0.02 | 2518 | X-RAY DIFFRACTION | r_gen_planes_other | | | X-RAY DIFFRACTION | r_nbd_refined0.234 | 0.2 | 1516 | X-RAY DIFFRACTION | r_nbd_other | | | X-RAY DIFFRACTION | r_nbtor_refined0.309 | 0.2 | 2052 | X-RAY DIFFRACTION | r_nbtor_other | | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.179 | 0.2 | 454 | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_metal_ion_refined | | | X-RAY DIFFRACTION | r_metal_ion_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.235 | 0.2 | 81 | X-RAY DIFFRACTION | r_symmetry_vdw_other | | | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.177 | 0.2 | 56 | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_refined | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_other | | | X-RAY DIFFRACTION | r_mcbond_it0.951 | 1.5 | 1861 | X-RAY DIFFRACTION | r_mcbond_other | | | X-RAY DIFFRACTION | r_mcangle_it1.536 | 2 | 2948 | X-RAY DIFFRACTION | r_scbond_it2.618 | 3 | 1394 | X-RAY DIFFRACTION | r_scangle_it3.879 | 4.5 | 1273 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.63→1.672 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.323 | 174 | - |
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Rwork | 0.242 | 1413 | - |
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obs | - | 1587 | 50.25 % |
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精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 1.531 | -0.0328 | 1.2006 | 0.2425 | 0.2133 | 1.8404 | 0.0525 | 0.0012 | -0.0523 | 0.007 | -0.0263 | -0.0035 | 0.0325 | -0.1625 | -0.0262 | -0.0312 | -0.0012 | 0.0063 | -0.0305 | 0.001 | -0.0863 | 6.9094 | 9.6763 | 14.9218 | 2 | 2.3298 | 0.2182 | 0.4613 | 1.1937 | 0.3736 | 0.2091 | 0.014 | 0.2703 | -0.264 | -0.0229 | 0.1002 | -0.2374 | -0.0545 | 0.065 | -0.1142 | -0.0441 | 0.0023 | 0.0131 | -0.0518 | -0.0625 | -0.016 | 40.9543 | 8.1522 | 21.6795 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Label asym-ID | Auth seq-ID | Label seq-ID |
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1 | X-RAY DIFFRACTION | 1 | AA8 - 173 | 10 - 175 | 2 | X-RAY DIFFRACTION | 2 | BB9 - 173 | 11 - 175 | | | | |
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