プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.954 Å / 相対比: 1
反射
解像度: 1.16→40 Å / Num. obs: 13772 / % possible obs: 97.7 %
反射 シェル
解像度: 1.16→1.2 Å / % possible all: 91.3
-
解析
ソフトウェア
名称
バージョン
分類
REFMAC
5.2.0005
精密化
SCALEPACK
データスケーリング
MOLREP
位相決定
精密化
構造決定の手法: 分子置換 / 解像度: 1.16→40 Å / Cor.coef. Fo:Fc: 0.977 / Cor.coef. Fo:Fc free: 0.967 / SU B: 1.147 / SU ML: 0.024 / 交差検証法: THROUGHOUT / ESU R: 0.042 / ESU R Free: 0.041 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.17733
1348
9.9 %
RANDOM
Rwork
0.14718
-
-
-
obs
0.15027
12224
97.79 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 14.037 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.36 Å2
0 Å2
-0.04 Å2
2-
-
-0.67 Å2
0 Å2
3-
-
-
0.3 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.16→40 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
392
0
1
63
456
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.018
0.022
400
X-RAY DIFFRACTION
r_bond_other_d
0.003
0.02
329
X-RAY DIFFRACTION
r_angle_refined_deg
1.672
1.973
543
X-RAY DIFFRACTION
r_angle_other_deg
1.131
3
782
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.224
5
50
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
27.37
25.294
17
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
10.225
15
65
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
13.488
15
1
X-RAY DIFFRACTION
r_chiral_restr
0.137
0.2
58
X-RAY DIFFRACTION
r_gen_planes_refined
0.025
0.02
446
X-RAY DIFFRACTION
r_gen_planes_other
0.015
0.02
75
X-RAY DIFFRACTION
r_nbd_refined
0.197
0.2
79
X-RAY DIFFRACTION
r_nbd_other
0.156
0.2
317
X-RAY DIFFRACTION
r_nbtor_refined
0.181
0.2
209
X-RAY DIFFRACTION
r_nbtor_other
0.084
0.2
224
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.179
0.2
31
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.129
0.2
5
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.285
0.2
22
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.233
0.2
12
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
2.3
2
333
X-RAY DIFFRACTION
r_mcbond_other
1.209
2
105
X-RAY DIFFRACTION
r_mcangle_it
2.61
3
409
X-RAY DIFFRACTION
r_scbond_it
2.718
2
184
X-RAY DIFFRACTION
r_scangle_it
3.141
3
134
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.16→1.19 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.398
85
-
Rwork
0.308
824
-
obs
-
-
90.09 %
精密化 TLS
手法: refined / Origin x: 8.988 Å / Origin y: -0.059 Å / Origin z: 3.296 Å