解像度: 1.4→35.71 Å / Cor.coef. Fo:Fc: 0.961 / Cor.coef. Fo:Fc free: 0.962 / SU B: 1.712 / SU ML: 0.034 / TLS residual ADP flag: LIKELY RESIDUAL / Isotropic thermal model: Isotropic / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.055 / ESU R Free: 0.053 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: SIMULATED ANNEALING WAS PERFORMED WITH THE CNS SOFTWARE IN THE FIRST CYCLE OF REFINEMENT. TLS APPLIED USING THE PROTEIN MODEL AS ONE GROUP. Close contacts in remark 500 are related to the ...詳細: SIMULATED ANNEALING WAS PERFORMED WITH THE CNS SOFTWARE IN THE FIRST CYCLE OF REFINEMENT. TLS APPLIED USING THE PROTEIN MODEL AS ONE GROUP. Close contacts in remark 500 are related to the alternate conformations of the CYS 6 region close to the N-terminus and CYS 31. The alternate conformation of the N-terminus is not modelled due to the weak electron density.
Rfactor
反射数
%反射
Selection details
Rfree
0.1895
676
5 %
RANDOM
Rwork
0.18014
-
-
-
all
0.1806
13610
-
-
obs
0.1806
13574
99.75 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 24.051 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.03 Å2
0 Å2
0 Å2
2-
-
0.21 Å2
0 Å2
3-
-
-
-0.24 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.4→35.71 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
402
0
0
74
476
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.014
0.022
432
X-RAY DIFFRACTION
r_angle_refined_deg
1.486
1.968
582
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.936
5
52
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.224
23.81
21
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
14.454
15
79
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.321
15
4
X-RAY DIFFRACTION
r_chiral_restr
0.083
0.2
59
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.02
332
X-RAY DIFFRACTION
r_nbd_refined
0.244
0.2
212
X-RAY DIFFRACTION
r_nbtor_refined
0.322
0.2
308
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.127
0.2
91
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.177
0.2
44
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.146
0.2
8
X-RAY DIFFRACTION
r_mcbond_it
0.74
1.5
269
X-RAY DIFFRACTION
r_mcangle_it
1.219
2
430
X-RAY DIFFRACTION
r_scbond_it
1.764
3
178
X-RAY DIFFRACTION
r_scangle_it
2.954
4.5
152
LS精密化 シェル
解像度: 1.403→1.439 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.38
55
-
Rwork
0.329
904
-
obs
-
904
97.96 %
精密化 TLS
手法: refined / Origin x: 12.833 Å / Origin y: 7.551 Å / Origin z: 24.913 Å