Type: WEISSENBERG / Detector: DIFFRACTOMETER / Date: Dec 8, 1998
Radiation
Protocol: SINGLE WAVELENGTH / Monochromatic (M) / Laue (L): M / Scattering type: x-ray
Radiation wavelength
Wavelength: 1 Å / Relative weight: 1
Reflection
Resolution: 2.5→37.5 Å / Num. obs: 19281 / % possible obs: 98.2 % / Redundancy: 3.4 % / Biso Wilson estimate: 36.1 Å2 / Rmerge(I) obs: 0.046 / Net I/σ(I): 10.3
Reflection shell
Resolution: 2.5→2.63 Å / Redundancy: 3.5 % / Rmerge(I) obs: 0.064 / Mean I/σ(I) obs: 9.8 / % possible all: 98.2
Reflection
*PLUS
Num. measured all: 64714
Reflection shell
*PLUS
% possible obs: 97.9 %
-
Processing
Software
Name
Version
Classification
SHARP
phasing
MLPHARE
phasing
X-PLOR
98.1
refinement
DENZO
datareduction
CCP4
(SCALA)
datascaling
Refinement
Method to determine structure: MIR / Resolution: 2.5→20 Å / Rfactor Rfree error: 0.007 / Data cutoff high absF: 10000000 / Data cutoff low absF: 0.001 / Cross valid method: THROUGHOUT / σ(F): 2 / Details: BULK SOLVENT MODEL USED
Rfactor
Num. reflection
% reflection
Selection details
Rfree
0.316
1883
10 %
RANDOM
Rwork
0.223
-
-
-
obs
0.223
19063
97 %
-
Displacement parameters
Biso mean: 28.5 Å2
Refine analyze
Free
Obs
Luzzati coordinate error
0.44 Å
0.3 Å
Luzzati d res low
-
5 Å
Luzzati sigma a
0.43 Å
0.26 Å
Refinement step
Cycle: LAST / Resolution: 2.5→20 Å
Protein
Nucleic acid
Ligand
Solvent
Total
Num. atoms
4296
0
0
284
4580
Refine LS restraints
Refine-ID
Type
Dev ideal
Dev ideal target
X-RAY DIFFRACTION
x_bond_d
0.01
X-RAY DIFFRACTION
x_bond_d_na
X-RAY DIFFRACTION
x_bond_d_prot
X-RAY DIFFRACTION
x_angle_d
X-RAY DIFFRACTION
x_angle_d_na
X-RAY DIFFRACTION
x_angle_d_prot
X-RAY DIFFRACTION
x_angle_deg
1.6
X-RAY DIFFRACTION
x_angle_deg_na
X-RAY DIFFRACTION
x_angle_deg_prot
X-RAY DIFFRACTION
x_dihedral_angle_d
26.7
X-RAY DIFFRACTION
x_dihedral_angle_d_na
X-RAY DIFFRACTION
x_dihedral_angle_d_prot
X-RAY DIFFRACTION
x_improper_angle_d
0.8
X-RAY DIFFRACTION
x_improper_angle_d_na
X-RAY DIFFRACTION
x_improper_angle_d_prot
X-RAY DIFFRACTION
x_mcbond_it
2.86
1.5
X-RAY DIFFRACTION
x_mcangle_it
4.25
2
X-RAY DIFFRACTION
x_scbond_it
4.5
2
X-RAY DIFFRACTION
x_scangle_it
5.87
2.5
LS refinement shell
Resolution: 2.5→2.66 Å / Rfactor Rfree error: 0.024 / Total num. of bins used: 6
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