解像度: 1.65→35.93 Å / Cor.coef. Fo:Fc: 0.972 / Cor.coef. Fo:Fc free: 0.96 / SU B: 3.17 / SU ML: 0.053 / TLS residual ADP flag: LIKELY RESIDUAL / Isotropic thermal model: ISOTROPIC / 交差検証法: THROUGHOUT / ESU R: 0.078 / ESU R Free: 0.08 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: 1, RESIDUES A77-79 HAVE AMBIGUOUS DIFFERENCE DENSITY AROUND THEM AND MAY BE MISTRACED; RESIDUE A78 WAS OMITTED. RESIDUE A163 HAS AMBIGUOUS SIDECHAIN DENSITY. RESIDUES A147-148 MAY HAVE AN ...詳細: 1, RESIDUES A77-79 HAVE AMBIGUOUS DIFFERENCE DENSITY AROUND THEM AND MAY BE MISTRACED; RESIDUE A78 WAS OMITTED. RESIDUE A163 HAS AMBIGUOUS SIDECHAIN DENSITY. RESIDUES A147-148 MAY HAVE AN ALTERNATIVE BACKBONE CONFORMATION, THAT WAS TOO AMBIGUOUS TO TRACE. THE ATOM 1 WAS BUILT AS CHLORINE BECAUSE IT PROVIDES THE BEST ELECTRONIC FIT FOR THE DIFFERENCE DENSITY, WHILE DISTANCES TO NEIGHBOURING WATERS ARE TOO LARGE FOR ISOELECTRONIC CATIONS. A POSSIBLE EXPLANATION FOR ITS PRESENCE IN THE UNCHARGED SITE IS THE LIKELY DIPOLE OF THE ADJACENT HELIX. 2, HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS.
Rfactor
反射数
%反射
Selection details
Rfree
0.18762
2036
5 %
RANDOM
Rwork
0.15768
-
-
-
obs
0.15918
38297
95.7 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 27.161 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.67 Å2
0 Å2
0 Å2
2-
-
1.31 Å2
0 Å2
3-
-
-
-1.98 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.65→35.93 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2090
0
1
295
2386
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.015
0.022
2155
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
2004
X-RAY DIFFRACTION
r_angle_refined_deg
1.409
1.955
2912
X-RAY DIFFRACTION
r_angle_other_deg
0.755
3
4657
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.544
5
263
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
29.186
23.939
99
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
14.127
15
392
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
12.53
15
16
X-RAY DIFFRACTION
r_chiral_restr
0.083
0.2
326
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.02
2365
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
431
X-RAY DIFFRACTION
r_nbd_refined
0.21
0.2
393
X-RAY DIFFRACTION
r_nbd_other
0.181
0.2
2008
X-RAY DIFFRACTION
r_nbtor_other
0.082
0.2
1268
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.236
0.2
238
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.2
0.2
28
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.245
0.2
119
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.26
0.2
40
X-RAY DIFFRACTION
r_mcbond_it
0.959
1.5
1321
X-RAY DIFFRACTION
r_mcangle_it
1.759
2
2142
X-RAY DIFFRACTION
r_scbond_it
2.522
3
834
X-RAY DIFFRACTION
r_scangle_it
4.32
4.5
770
LS精密化 シェル
解像度: 1.65→1.693 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.276
121
5.38 %
Rwork
0.277
2128
-
精密化 TLS
手法: refined / Origin x: 8.823 Å / Origin y: 32.636 Å / Origin z: 20.851 Å