ソフトウェア | 名称 | バージョン | 分類 |
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DENZO | | データ削減 | SCALEPACK | | データスケーリング | SnB | | 位相決定 | CNS | 1.1 | 精密化 |
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精密化 | 構造決定の手法: 単波長異常分散 / 解像度: 1.8→29.69 Å / Rfactor Rfree error: 0.002 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0 / 立体化学のターゲット値: Engh & Huber
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.219 | 17177 | 7.3 % | RANDOM |
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Rwork | 0.192 | - | - | - |
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obs | 0.1921 | 235313 | 97 % | - |
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all | - | 235313 | - | - |
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溶媒の処理 | 溶媒モデル: FLAT MODEL / Bsol: 47.504 Å2 / ksol: 0.37796 e/Å3 |
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原子変位パラメータ | Biso mean: 18 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 1.32 Å2 | 0 Å2 | 0.69 Å2 |
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2- | - | -1.03 Å2 | 0 Å2 |
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3- | - | - | -0.29 Å2 |
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Refine analyze | Luzzati coordinate error free: 0.22 Å / Luzzati sigma a free: 0.09 Å |
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精密化ステップ | サイクル: LAST / 解像度: 1.8→29.69 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 9514 | 0 | 0 | 1046 | 10560 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | c_bond_d0.005 | | X-RAY DIFFRACTION | c_bond_d_na | | X-RAY DIFFRACTION | c_bond_d_prot | | X-RAY DIFFRACTION | c_angle_d | | X-RAY DIFFRACTION | c_angle_d_na | | X-RAY DIFFRACTION | c_angle_d_prot | | X-RAY DIFFRACTION | c_angle_deg1.2 | | X-RAY DIFFRACTION | c_angle_deg_na | | X-RAY DIFFRACTION | c_angle_deg_prot | | X-RAY DIFFRACTION | c_dihedral_angle_d21.5 | | X-RAY DIFFRACTION | c_dihedral_angle_d_na | | X-RAY DIFFRACTION | c_dihedral_angle_d_prot | | X-RAY DIFFRACTION | c_improper_angle_d0.79 | | X-RAY DIFFRACTION | c_improper_angle_d_na | | X-RAY DIFFRACTION | c_improper_angle_d_prot | | X-RAY DIFFRACTION | c_mcbond_it1.21 | 1.5 | X-RAY DIFFRACTION | c_mcangle_it1.82 | 2 | X-RAY DIFFRACTION | c_scbond_it2.22 | 2 | X-RAY DIFFRACTION | c_scangle_it3.26 | 2.5 | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.8→1.91 Å / Rfactor Rfree error: 0.004 / Total num. of bins used: 6
| Rfactor | 反射数 | %反射 |
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Rfree | 0.242 | 2900 | 7.7 % |
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Rwork | 0.207 | 34956 | - |
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obs | - | - | 93.5 % |
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Xplor file | Refine-ID | Serial no | Param file | Topol file |
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X-RAY DIFFRACTION | 1 | PROTEIN_REP.PARAMPROTEIN.TOPX-RAY DIFFRACTION | 2 | WATER_REP.PARAMWATER.TOPX-RAY DIFFRACTION | 3 | MSE.PARMSE.TOP | | | | | |
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精密化 | *PLUS 最高解像度: 1.8 Å / 最低解像度: 30 Å / Rfactor Rfree: 0.217 / Rfactor Rwork: 0.188 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | c_dihedral_angle_d | X-RAY DIFFRACTION | c_dihedral_angle_deg21.5 | X-RAY DIFFRACTION | c_improper_angle_d | X-RAY DIFFRACTION | c_improper_angle_deg0.79 | | | | |
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