ソフトウェア | 名称 | 分類 |
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DENZO | データ削減 | SCALEPACK | データスケーリング | CNS | 精密化 | CNS | 位相決定 |
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精密化 | 解像度: 3→29.8 Å / Rfactor Rfree error: 0.005 / Data cutoff high absF: 1008569.15 / Data cutoff low absF: 0 / Isotropic thermal model: GROUP / 交差検証法: THROUGHOUT / σ(F): 3
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.283 | 3753 | 9 % | RANDOM |
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Rwork | 0.228 | - | - | - |
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obs | 0.228 | 41869 | 84.4 % | - |
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all | - | 49633 | - | - |
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溶媒の処理 | 溶媒モデル: FLAT MODEL / Bsol: 27.4224 Å2 / ksol: 0.311691 e/Å3 |
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原子変位パラメータ | Biso mean: 67.5 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | -17.08 Å2 | 0 Å2 | 0 Å2 |
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2- | - | 1 Å2 | 0 Å2 |
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3- | - | - | 16.08 Å2 |
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Refine analyze | | Free | Obs |
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Luzzati coordinate error | 0.49 Å | 0.37 Å |
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Luzzati d res low | - | 5 Å |
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Luzzati sigma a | 0.62 Å | 0.48 Å |
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精密化ステップ | サイクル: LAST / 解像度: 3→29.8 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 11914 | 0 | 0 | 0 | 11914 |
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拘束条件 | Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | c_bond_d0.008 | X-RAY DIFFRACTION | c_bond_d_na | X-RAY DIFFRACTION | c_bond_d_prot | X-RAY DIFFRACTION | c_angle_d | X-RAY DIFFRACTION | c_angle_d_na | X-RAY DIFFRACTION | c_angle_d_prot | X-RAY DIFFRACTION | c_angle_deg1.4 | X-RAY DIFFRACTION | c_angle_deg_na | X-RAY DIFFRACTION | c_angle_deg_prot | X-RAY DIFFRACTION | c_dihedral_angle_d20.7 | X-RAY DIFFRACTION | c_dihedral_angle_d_na | X-RAY DIFFRACTION | c_dihedral_angle_d_prot | X-RAY DIFFRACTION | c_improper_angle_d0.87 | X-RAY DIFFRACTION | c_improper_angle_d_na | X-RAY DIFFRACTION | c_improper_angle_d_prot | X-RAY DIFFRACTION | c_mcbond_it | X-RAY DIFFRACTION | c_mcangle_it | X-RAY DIFFRACTION | c_scbond_it | X-RAY DIFFRACTION | c_scangle_it | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 3→3.19 Å / Rfactor Rfree error: 0.018 / Total num. of bins used: 6
| Rfactor | 反射数 | %反射 |
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Rfree | 0.408 | 511 | 10.1 % |
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Rwork | 0.331 | 4571 | - |
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obs | - | - | 62 % |
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Xplor file | Serial no: 1 / Param file: PROTEIN_REP.PARAM / Topol file: PROTEIN.TOP |
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精密化 | *PLUS 最低解像度: 30 Å |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | c_angle_deg1.38 | X-RAY DIFFRACTION | c_dihedral_angle_d | X-RAY DIFFRACTION | c_dihedral_angle_deg20.7 | X-RAY DIFFRACTION | c_improper_angle_d | X-RAY DIFFRACTION | c_improper_angle_deg0.87 | | | | | |
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LS精密化 シェル | *PLUS 最低解像度: 3.11 Å / Rfactor Rfree: 0.417 / Rfactor Rwork: 0.347 |
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