ソフトウェア | 名称 | バージョン | 分類 |
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X-PLOR | 3.8 | モデル構築 | X-PLOR | 3.8 | 精密化 | R-AXIS | | データ削減 | R-AXIS | | データスケーリング | X-PLOR | 3.8 | 位相決定 |
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精密化 | 解像度: 1.8→10 Å / Rfactor Rfree error: 0.007 / Data cutoff high absF: 10000000 / Data cutoff low absF: 0.001 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.227 | 1121 | 10.3 % | RANDOM |
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Rwork | 0.18 | - | - | - |
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obs | 0.18 | 10908 | 90.2 % | - |
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原子変位パラメータ | Biso mean: 10.4 Å2 |
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Refine analyze | | Free | Obs |
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Luzzati coordinate error | 0.22 Å | 0.17 Å |
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Luzzati d res low | - | 10 Å |
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Luzzati sigma a | 0.11 Å | 0.08 Å |
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精密化ステップ | サイクル: LAST / 解像度: 1.8→10 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 973 | 0 | 6 | 222 | 1201 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | x_bond_d0.017 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg2.63 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d19.1 | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d1.18 | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it0.89 | 1.5 | X-RAY DIFFRACTION | x_mcangle_it1.23 | 2 | X-RAY DIFFRACTION | x_scbond_it2.12 | 2 | X-RAY DIFFRACTION | x_scangle_it3.12 | 2.5 | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.8→1.86 Å / Rfactor Rfree error: 0.028 / Total num. of bins used: 10
| Rfactor | 反射数 | %反射 |
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Rfree | 0.261 | 89 | 10.3 % |
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Rwork | 0.228 | 771 | - |
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obs | - | - | 72 % |
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Xplor file | Refine-ID | Serial no | Param file | Topol file |
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X-RAY DIFFRACTION | 1 | MHR_PARAM.PROMHR_TOPOL.PROX-RAY DIFFRACTION | 2 | | | | |
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ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.8 / 分類: refinement |
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精密化 | *PLUS Rfactor obs: 0.18 / Rfactor Rwork: 0.18 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | x_dihedral_angle_d | X-RAY DIFFRACTION | x_dihedral_angle_deg19.1 | X-RAY DIFFRACTION | x_improper_angle_d | X-RAY DIFFRACTION | x_improper_angle_deg1.18 | | | | |
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