解像度: 1.67→39.31 Å / Cor.coef. Fo:Fc: 0.966 / Cor.coef. Fo:Fc free: 0.943 / SU B: 4.301 / SU ML: 0.076 / 交差検証法: THROUGHOUT / ESU R: 0.124 / ESU R Free: 0.125 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.23563
1415
5 %
RANDOM
Rwork
0.1874
-
-
-
obs
0.18974
26668
88.97 %
-
all
-
53368
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 35.367 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.23 Å2
0 Å2
-0.12 Å2
2-
-
0.24 Å2
0 Å2
3-
-
-
-0.1 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.67→39.31 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2103
0
32
243
2378
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.009
0.019
2204
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.191
1.982
2984
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.333
5
260
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
32.149
23.163
98
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.693
15
399
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
21.686
15
19
X-RAY DIFFRACTION
r_chiral_restr
0.083
0.2
329
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.021
1640
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
431
X-RAY DIFFRACTION
r_nbd_refined
0.216
0.2
413
X-RAY DIFFRACTION
r_nbd_other
0.178
0.2
1971
X-RAY DIFFRACTION
r_nbtor_refined
0.179
0.2
1046
X-RAY DIFFRACTION
r_nbtor_other
0.079
0.2
1155
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.185
0.2
134
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.12
0.2
13
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.233
0.2
42
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.242
0.2
12
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.752
2
1342
X-RAY DIFFRACTION
r_mcbond_other
0.434
2
513
X-RAY DIFFRACTION
r_mcangle_it
2.328
3
2071
X-RAY DIFFRACTION
r_scbond_it
1.855
2
945
X-RAY DIFFRACTION
r_scangle_it
2.636
3
816
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.671→1.714 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.29
59
-
Rwork
0.271
1137
-
obs
-
-
51.11 %
精密化 TLS
手法: refined / Origin x: -10.9339 Å / Origin y: 0.9242 Å / Origin z: -18.4967 Å