ENGINEERED RESIDUE IN CHAIN A, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN C, THR 335 TO ALA ...ENGINEERED RESIDUE IN CHAIN A, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN C, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN E, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN G, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN I, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN K, THR 335 TO ALA ENGINEERED RESIDUE IN CHAIN A, PHE 336 TO MET ENGINEERED RESIDUE IN CHAIN C, PHE 336 TO MET ENGINEERED RESIDUE IN CHAIN E, PHE 336 TO MET ENGINEERED RESIDUE IN CHAIN G, PHE 336 TO MET ENGINEERED RESIDUE IN CHAIN I, PHE 336 TO MET ENGINEERED RESIDUE IN CHAIN K, PHE 336 TO MET
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実験情報
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実験
実験
手法: X線回折 / 使用した結晶の数: 1
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試料調製
結晶
マシュー密度: 2.3 Å3/Da / 溶媒含有率: 47 % / 解説: NONE
結晶化
pH: 6 / 詳細: PEG 8K, PIPES PH 6
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データ収集
回折
平均測定温度: 100 K
放射光源
由来: シンクロトロン / サイト: APS / ビームライン: 22-ID / 波長: 1
検出器
タイプ: MARRESEARCH / 検出器: CCD
放射
プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 1 Å / 相対比: 1
反射
解像度: 2.28→125 Å / Num. obs: 177300 / % possible obs: 86 % / Observed criterion σ(I): 1.5 / 冗長度: 4 % / Biso Wilson estimate: 47.5 Å2 / Rmerge(I) obs: 0.08 / Net I/σ(I): 18.6
反射 シェル
解像度: 2.28→2.38 Å / 冗長度: 1.2 % / Rmerge(I) obs: 0.35 / Mean I/σ(I) obs: 1.5 / % possible all: 51.4
解像度: 2.29→138.68 Å / Cor.coef. Fo:Fc: 0.957 / Cor.coef. Fo:Fc free: 0.926 / SU B: 15.517 / SU ML: 0.194 / 交差検証法: THROUGHOUT / ESU R: 0.53 / ESU R Free: 0.273 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. ATOM RECORD CONTAINS SUM OF TLS AND RESIDUAL B FACTORS. ANISOU RECORD CONTAINS SUM OF TLS AND RESIDUAL U FACTORS.
Rfactor
反射数
%反射
Selection details
Rfree
0.24456
7632
5 %
RANDOM
Rwork
0.18571
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obs
0.18863
144572
87.7 %
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溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK