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タイトル | Modeling truncated pixel values of faint reflections in MicroED images. |
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ジャーナル・号・ページ | J Appl Crystallogr, Vol. 49, Issue Pt 3, Page 1029-1034, Year 2016 |
掲載日 | 2016年6月1日 |
著者 | Johan Hattne / Dan Shi / M Jason de la Cruz / Francis E Reyes / Tamir Gonen / |
PubMed 要旨 | The weak pixel counts surrounding the Bragg spots in a diffraction image are important for establishing a model of the background underneath the peak and estimating the reliability of the integrated ...The weak pixel counts surrounding the Bragg spots in a diffraction image are important for establishing a model of the background underneath the peak and estimating the reliability of the integrated intensities. Under certain circumstances, particularly with equipment not optimized for low-intensity measurements, these pixel values may be corrupted by corrections applied to the raw image. This can lead to truncation of low pixel counts, resulting in anomalies in the integrated Bragg intensities, such as systematically higher signal-to-noise ratios. A correction for this effect can be approximated by a three-parameter lognormal distribution fitted to the weakly positive-valued pixels at similar scattering angles. The procedure is validated by the improved refinement of an atomic model against structure factor amplitudes derived from corrected micro-electron diffraction (MicroED) images. |
リンク | J Appl Crystallogr / PubMed:27275145 / PubMed Central |
手法 | EM (電子線結晶学) |
解像度 | 1.75 Å |
構造データ | |
化合物 | ChemComp-SO4: ChemComp-HOH: |
由来 |
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キーワード | HYDROLASE |