解像度: 1.51→20 Å / Cor.coef. Fo:Fc: 0.975 / SU B: 0.842 / SU ML: 0.031 / 交差検証法: THROUGHOUT / ESU R: 0.055 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.152
5722
5 %
RANDOM
Rwork
0.14568
-
-
-
obs
0.14568
114339
99.92 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 11.917 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.01 Å2
0.01 Å2
-0 Å2
2-
-
0.01 Å2
-0 Å2
3-
-
-
-0.02 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.51→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4383
0
39
862
5284
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.008
0.022
5068
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
3334
X-RAY DIFFRACTION
r_angle_refined_deg
1.21
1.961
6974
X-RAY DIFFRACTION
r_angle_other_deg
0.834
3
8130
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.357
5
675
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
32.661
23.684
228
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
11.206
15
765
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
12.983
15
40
X-RAY DIFFRACTION
r_chiral_restr
0.072
0.2
771
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.021
5951
X-RAY DIFFRACTION
r_gen_planes_other
0.002
0.02
1064
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.166
0.2
653
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.187
0.2
11
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.242
0.2
61
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.168
0.2
78
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.532
1.5
3204
X-RAY DIFFRACTION
r_mcbond_other
0.12
1.5
1292
X-RAY DIFFRACTION
r_mcangle_it
0.983
2
5224
X-RAY DIFFRACTION
r_scbond_it
1.581
3
1864
X-RAY DIFFRACTION
r_scangle_it
2.563
4.5
1750
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.511→1.55 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rwork
0.219
8299
-
Rfree
-
0
-
obs
-
-
99.89 %
精密化 TLS
手法: refined / Origin x: 15.808 Å / Origin y: 64.846 Å / Origin z: -0.254 Å