5UFU
Structure of AMPK bound to activator
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2016-09-13 |
Detector | DECTRIS PILATUS 6M-F |
Wavelength(s) | 1 |
Spacegroup name | P 61 2 2 |
Unit cell lengths | 124.264, 124.264, 401.569 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 47.430 - 3.450 |
R-factor | 0.195 |
Rwork | 0.193 |
R-free | 0.23800 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.009 |
RMSD bond angle | 1.140 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHASER |
Refinement software | BUSTER (2.11.7) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 47.430 | 3.510 |
High resolution limit [Å] | 3.450 | 3.450 |
Rpim | 0.095 | 35.400 |
Number of reflections | 25121 | |
<I/σ(I)> | 9.9 | |
Completeness [%] | 99.9 | |
Redundancy | 8.1 | |
CC(1/2) | 0.817 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 750 mM ammonium sulfate 500 mM lithium sulfate 100 mM trisodium citrate 1% ethylene glycol |