5F5X
Crystal structure of S116A Ba3275 with AMP bound
Experimental procedure
実験手法 | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 19-ID |
Synchrotron site | APS |
Beamline | 19-ID |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2015-05-27 |
Detector | ADSC QUANTUM 315r |
Wavelength(s) | 0.9794 |
Spacegroup name | P 1 21 1 |
格子定数 [Å] | 55.116, 117.728, 54.852 |
格子定数 [度] | 90.00, 95.27, 90.00 |
精密化法
残基 | 31.922 - 2.006 |
R因子 | 0.2149 |
Rwork | 0.213 |
R-free | 0.24660 |
Structure solution method | SAD |
結合長の平均二乗偏差(RMSD) [Å] | 0.003 |
結合角の平均二乗偏差(RMSD) [度] | 0.731 |
Data reduction software | HKL-3000 |
Data scaling software | HKL-3000 |
Phasing software | MOLREP |
Refinement software | PHENIX (dev_1888) |
Quality characteristics
Overall | |
分解能 [Å] (低) | 32.000 |
分解能 [Å] (高) | 2.000 |
Rmerge_l_obs | 0.087 |
独立反射数 | 45151 |
<I/σ(I)> | 11.6 |
完全性 [%] | 97.6 |
冗長性 | 2.8 |
結晶化条件
結晶ID | 方法 | pH | 温度 | 溶液条件 |
1 | VAPOR DIFFUSION, SITTING DROP | 5 | 293 | Malate pH 5.0 0.15M, Peg 1000 %(w/v), Sodium fluoride 0.004 M |