4MI5
Crystal structure of the EZH2 SET domain
Experimental procedure
実験手法 | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 31-ID |
Synchrotron site | APS |
Beamline | 31-ID |
Detector technology | CCD |
Collection date | 2008-04-22 |
Detector | MAR CCD 165 mm |
Wavelength(s) | 1.2821 |
Spacegroup name | P 21 21 21 |
格子定数 [Å] | 45.134, 57.674, 75.501 |
格子定数 [度] | 90.00, 90.00, 90.00 |
精密化法
残基 | 21.020 - 2.000 |
R因子 | 0.19931 |
Rwork | 0.196 |
R-free | 0.25671 |
Structure solution method | SAD |
結合長の平均二乗偏差(RMSD) [Å] | 0.005 |
結合角の平均二乗偏差(RMSD) [度] | 0.978 |
Refinement software | REFMAC (5.7.0029) |
Quality characteristics
Overall | |
分解能 [Å] (高) | 2.000 |
独立反射数 | 13157 |
完全性 [%] | 95.6 |
結晶化条件
結晶ID | 方法 | pH | 温度 | 溶液条件 |
1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 294 | 100mM MES pH 6.5, 30% PEG MME 5K, 200mM Ammonium Sulfate, VAPOR DIFFUSION, SITTING DROP, temperature 294K |