2XRN
Crystal structure of TtgV
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | DIAMOND BEAMLINE I04 |
Synchrotron site | Diamond |
Beamline | I04 |
Temperature [K] | 100 |
Detector technology | CCD |
Detector | ADSC CCD |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 70.862, 116.184, 71.881 |
Unit cell angles | 90.00, 104.34, 90.00 |
Refinement procedure
Resolution | 44.609 - 2.900 |
R-factor | 0.2156 |
Rwork | 0.212 |
R-free | 0.27900 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.005 |
RMSD bond angle | 0.986 |
Data reduction software | MOSFLM |
Phasing software | PHASER |
Refinement software | PHENIX ((PHENIX.REFINE)) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 69.000 |
High resolution limit [Å] | 2.900 |
Rmerge | 0.080 |
Number of reflections | 12547 |
Completeness [%] | 99.7 |
Redundancy | 3.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 |