構造決定の手法: 分子置換 / 解像度: 1.74→42.418 Å / Cor.coef. Fo:Fc: 0.955 / Cor.coef. Fo:Fc free: 0.944 / SU B: 8.256 / SU ML: 0.124 / 交差検証法: THROUGHOUT / ESU R: 0.132 / ESU R Free: 0.126 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Rfree
0.2632
1494
5.142 %
Rwork
0.2322
27562
-
all
0.234
-
-
obs
-
29056
99.842 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 48.659 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.556 Å2
-0.278 Å2
-0 Å2
2-
-
-0.556 Å2
0 Å2
3-
-
-
1.804 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.74→42.418 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1875
0
72
66
2013
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.01
0.012
1993
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.016
1835
X-RAY DIFFRACTION
r_angle_refined_deg
1.926
1.823
2702
X-RAY DIFFRACTION
r_angle_other_deg
0.629
1.735
4275
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
8.053
5
254
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
26.519
13.571
14
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
14.566
10
299
X-RAY DIFFRACTION
r_dihedral_angle_6_deg
14.29
10
69
X-RAY DIFFRACTION
r_chiral_restr
0.095
0.2
300
X-RAY DIFFRACTION
r_gen_planes_refined
0.01
0.02
2266
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
398
X-RAY DIFFRACTION
r_nbd_refined
0.203
0.2
389
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.196
0.2
1709
X-RAY DIFFRACTION
r_nbtor_refined
0.182
0.2
1027
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.092
0.2
1079
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.118
0.2
78
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.288
0.2
9
X-RAY DIFFRACTION
r_nbd_other
0.123
0.2
41
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.266
0.2
4
X-RAY DIFFRACTION
r_mcbond_it
3.072
2.991
1022
X-RAY DIFFRACTION
r_mcbond_other
3.064
2.99
1022
X-RAY DIFFRACTION
r_mcangle_it
3.927
5.374
1274
X-RAY DIFFRACTION
r_mcangle_other
3.929
5.375
1275
X-RAY DIFFRACTION
r_scbond_it
3.536
3.097
971
X-RAY DIFFRACTION
r_scbond_other
3.534
3.096
972
X-RAY DIFFRACTION
r_scangle_it
4.693
5.605
1428
X-RAY DIFFRACTION
r_scangle_other
4.691
5.604
1429
X-RAY DIFFRACTION
r_lrange_it
6.605
29.129
2208
X-RAY DIFFRACTION
r_lrange_other
6.607
29.105
2204
X-RAY DIFFRACTION
r_ncsr_local_group_1
0.1
0.05
3593
Refine LS restraints NCS
Ens-ID
Dom-ID
Auth asym-ID
Refine-ID
タイプ
Rms dev position (Å)
Weight position
1
1
B
X-RAY DIFFRACTION
Localncs
0.10033
0.05008
1
2
A
X-RAY DIFFRACTION
Localncs
0.10033
0.05008
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20