SEQUENCE THE COMPLETE SEQUENCE OF THE CRYSTALLIZED POLYPEPTIDE IS ... SEQUENCE THE COMPLETE SEQUENCE OF THE CRYSTALLIZED POLYPEPTIDE IS MHHHHHHSSGRENLYFQGKIAEKIKEKERQQKKRQEEIKKRLEEPEEPKVLTPEEQ LADKLRLKKLQEESDLELAKETFGVNNAVYGIDAMNPSSRDDFTEFGKLLKDKITQ YEKSLYYASFLEVLVRDVCISLEIDDLKKITNSLTVLCSEKQKQEKQSKAK FROM WHICH MHHHHHHSSGRENLYFQG IS AN EXPRESSION TAG, AND THE FOLLOWING SEQUENCE MATCHES THE FRAGMENT 76-220 OF THE UNIPROT ENTRY O75822. AUTHORS STATE THAT MANY OF THE N-TERMINAL RESIDUES WERE CLEAVED OFF PRIOR TO THE CRYSTAL FORMATION, BECAUSE OF THE PRESENCE OF CHYMOTRYPSIN IN CRYSTALLIZATION SOLUTION. THE PRECISE LOCATION OF THE CLEAVAGE SITE HAS NOT BEEN DETERMINED. THEREFORE, THE SEQUENCE INFORMATION, AS WELL AS THE VALUES OF MATTHEWS COEFFICIENT AND SOLVENT CONTENT ARE BASED ON THE CHAIN LENGTH STARTING FROM THE FIRST VISIBLE N-TERMINAL RESIDUE IN ELECTRON DENSITY.
マシュー密度: 2.28 Å3/Da / 溶媒含有率: 45.97 % 解説: A heavy atom derivative was prepared by overnight soaking of a protein crystal in a 1:19 mixture of 0.2M thimerosal and cryoprotectant (25% PEG 3350, 10% PEG, 0.1M Sodium acetate pH 4.6). ...解説: A heavy atom derivative was prepared by overnight soaking of a protein crystal in a 1:19 mixture of 0.2M thimerosal and cryoprotectant (25% PEG 3350, 10% PEG, 0.1M Sodium acetate pH 4.6). Diffraction intensities for this derivative are deposited with crystal index 2 (index 1 for native intensities).
結晶化
温度: 291 K / 手法: 蒸気拡散法, シッティングドロップ法 / pH: 4.5 詳細: 25% PEG 3350, 0.1M Sodium acetate. Chymotrypsin was added to the crystallization sample at a molar ratio of approx. 1:100, pH 4.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
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データ収集
回折
ID
平均測定温度 (K)
Crystal-ID
1
100
1
2
100
1
放射光源
由来
タイプ
ID
波長 (Å)
回転陽極
RIGAKU FR-E
1
1.5418
回転陽極
RIGAKU FR-E
2
1.5418
検出器
タイプ
ID
検出器
日付
RIGAKU RAXIS
1
IMAGE PLATE
2007年12月17日
RIGAKU RAXIS
2
IMAGE PLATE
2007年12月14日
放射
ID
プロトコル
単色(M)・ラウエ(L)
散乱光タイプ
Wavelength-ID
1
SINGLEWAVELENGTH
M
x-ray
1
2
SINGLEWAVELENGTH
M
x-ray
1
放射波長
波長: 1.5418 Å / 相対比: 1
反射
解像度: 1.85→30 Å / Num. obs: 29322 / % possible obs: 99.7 % / 冗長度: 7.3 % / Rmerge(I) obs: 0.041 / Χ2: 1.813 / Net I/σ(I): 24.6
反射 シェル
解像度 (Å)
冗長度 (%)
Rmerge(I) obs
Num. unique all
Χ2
Diffraction-ID
% possible all
1.85-1.92
7.2
0.877
2876
1.538
1,2
100
1.92-1.99
7.3
0.597
2877
1.598
1,2
100
1.99-2.08
7.3
0.349
2902
1.68
1,2
100
2.08-2.19
7.4
0.196
2901
1.775
1,2
100
2.19-2.33
7.4
0.132
2914
1.82
1,2
100
2.33-2.51
7.5
0.086
2916
1.859
1,2
100
2.51-2.76
7.5
0.052
2942
1.792
1,2
100
2.76-3.16
7.5
0.036
2953
1.72
1,2
100
3.16-3.98
7.4
0.031
2966
1.787
1,2
99.2
3.98-30
6.9
0.035
3075
2.564
1,2
98.1
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位相決定
位相決定
手法: 分子置換
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解析
ソフトウェア
名称
バージョン
分類
NB
DENZO
データ削減
SCALEPACK
データスケーリング
SHELX
位相決定
RESOLVE
位相決定
REFMAC
5.3.0037
精密化
PDB_EXTRACT
3.004
データ抽出
SHELXD
位相決定
精密化
構造決定の手法: 単一同系置換・異常分散 / 解像度: 1.85→25 Å / Cor.coef. Fo:Fc: 0.953 / Cor.coef. Fo:Fc free: 0.945 / WRfactor Rfree: 0.281 / WRfactor Rwork: 0.242 / SU B: 7.622 / SU ML: 0.114 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.146 / ESU R Free: 0.139 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. Atomic B factors are residuals from TLS refinement. Programs resolve, arp/warp, coot, molprobity have also been used in refinement.
Rfactor
反射数
%反射
Selection details
Rfree
0.263
1442
4.947 %
thin shells (from program SFTOOLS)
Rwork
0.229
-
-
-
obs
0.23
29151
99.6 %
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溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 39.914 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.208 Å2
0 Å2
0 Å2
2-
-
-0.654 Å2
0 Å2
3-
-
-
0.862 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.85→25 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2123
0
4
50
2177
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.016
0.022
2155
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1391
X-RAY DIFFRACTION
r_angle_refined_deg
1.339
1.99
2917
X-RAY DIFFRACTION
r_angle_other_deg
0.947
3
3437
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.404
5
281
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
26.242
25.316
79
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.645
15
374
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
14.822
15
6
X-RAY DIFFRACTION
r_chiral_restr
0.085
0.2
359
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.02
2381
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
413
X-RAY DIFFRACTION
r_nbd_refined
0.229
0.2
491
X-RAY DIFFRACTION
r_nbd_other
0.168
0.2
1386
X-RAY DIFFRACTION
r_nbtor_refined
0.18
0.2
1144
X-RAY DIFFRACTION
r_nbtor_other
0.089
0.2
1059
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.144
0.2
66
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.217
0.2
10
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.369
0.2
24
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.187
0.2
4
X-RAY DIFFRACTION
r_mcbond_it
2.392
2
1445
X-RAY DIFFRACTION
r_mcbond_other
0.772
2
568
X-RAY DIFFRACTION
r_mcangle_it
3.214
3
2256
X-RAY DIFFRACTION
r_scbond_it
2.774
2
801
X-RAY DIFFRACTION
r_scangle_it
3.852
3
661
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20